TWI833901B - Processing methods of processed objects - Google Patents
Processing methods of processed objects Download PDFInfo
- Publication number
- TWI833901B TWI833901B TW109104645A TW109104645A TWI833901B TW I833901 B TWI833901 B TW I833901B TW 109104645 A TW109104645 A TW 109104645A TW 109104645 A TW109104645 A TW 109104645A TW I833901 B TWI833901 B TW I833901B
- Authority
- TW
- Taiwan
- Prior art keywords
- tray
- processing
- workpiece
- transport
- wafers
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/67333—Trays for chips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67282—Marking devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67294—Apparatus for monitoring, sorting or marking using identification means, e.g. labels on substrates or labels on containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Details Of Rigid Or Semi-Rigid Containers (AREA)
- Packaging Frangible Articles (AREA)
- Dicing (AREA)
Abstract
在搬送托盤為特定種類時,可將資訊寫入記錄媒體。 When the transport pallet is of a specific type, information can be written into the recording medium.
搬送 托盤1容納多個元件晶片204而進行搬送。搬送托盤1具備:托盤本體2,其具備元件支撐部6及框體7,該元件支撐部6具有支撐多個元件晶片204的表面6-1,該框體7係圍繞元件支撐部6的外周而形成;記錄媒體4,設置於托盤本體2且可藉由無線通信寫入或讀取資訊;及識別標記5,識別搬送托盤1是否為可將資訊寫入記錄媒體4的種類。 move The tray 1 accommodates and transports a plurality of component wafers 204 . The transfer tray 1 is provided with a tray body 2 which has a component support part 6 having a surface 6 - 1 for supporting a plurality of component wafers 204 and a frame 7 which surrounds the outer periphery of the component support part 6 The recording medium 4 is provided on the tray body 2 and can write or read information through wireless communication; and the identification mark 5 identifies whether the transport tray 1 is of a type that can write information on the recording medium 4 .
Description
本發明係關於一種容納加工後之晶片的搬送托盤以及被加工物之加工方法。 The present invention relates to a transfer tray for accommodating processed wafers and a processing method of a workpiece.
在半導體業界中,例如有將藉由切割裝置所分割之多個晶片容納於一個托盤以搬送至下一步驟的製程(例如,參照專利文獻1)。此時,為了將加工時的資訊也一併傳遞至下一步驟而開發出了一種作為搬送手段之框架,其具備RFID(Radio Frequency identifier,無線射頻識別)標籤(例如,參照專利文獻2)。 In the semiconductor industry, for example, there is a process in which a plurality of wafers divided by a dicing device are accommodated in one tray and transported to the next step (see, for example, Patent Document 1). At this time, in order to transmit the information during processing to the next step, a frame as a transportation means has been developed, which has an RFID (Radio Frequency Identifier, Radio Frequency Identification) tag (for example, see Patent Document 2).
[先前技術文獻] [Prior technical literature]
[專利文獻] [Patent Document]
[專利文獻1]日本特開2000-095291號公報 [Patent Document 1] Japanese Patent Application Publication No. 2000-095291
[專利文獻2]日本特開2008-040810號公報 [Patent Document 2] Japanese Patent Application Publication No. 2008-040810
然而,當加工裝置的提供者建議使用特定的搬送托盤時,要求僅在使用建議之搬送托盤時允許於記錄媒體中寫入加工資訊等的資訊,並管理分割後的晶片品質。如此,在專利文獻2所示之搬送手段中,期望在搬送手段為特定種類時,於記錄媒體中寫入資訊。 However, when the provider of the processing equipment recommends the use of a specific transfer pallet, it is required to allow information such as processing information to be written in the recording medium only when the recommended transfer pallet is used, and to manage the quality of the divided wafers. In this way, in the conveyance means shown in Patent Document 2, it is desirable to write information in the recording medium when the conveyance means is of a specific type.
本發明係鑒於所述之問題點而完成,其目的在於提供一種在搬送托盤為特定種類時可將資訊寫入記錄媒體的搬送托盤以及被加工物之加工方法。 The present invention was made in view of the above-mentioned problems, and an object thereof is to provide a transport pallet that can write information on a recording medium when the transport pallet is of a specific type, and a processing method of a workpiece.
為了解決上述課題而達成目的,本發明之搬送托盤,係容納多個晶片而進行搬送的搬送托盤,其特徵為具備:托盤本體,其具備元件支撐部及框體,該元件支撐部具有支撐多個晶片的表面,該框體係圍繞該元件支撐部的外周而形成;記錄媒體,設置於該托盤本體且可藉由無線通信寫入或讀取資訊;及識別標記,識別該搬送托盤是否為可寫入該記錄媒體的種類。In order to solve the above-mentioned problems and achieve the object, the transfer tray of the present invention is a transfer tray that accommodates a plurality of wafers and carries them, and is characterized in that it includes: a tray body, which is provided with a component support part and a frame, and the component support part has a support structure for supporting multiple wafers. On the surface of a chip, the frame system is formed around the periphery of the component support part; a recording medium is provided on the tray body and can write or read information through wireless communication; and an identification mark identifies whether the transfer tray is acceptable. The type of recording medium to write to.
該搬送托盤中亦可具備黏著層,該黏著層裝設於該托盤本體的元件支撐部之表面並具有黏著力。The transfer tray may also be provided with an adhesive layer, which is installed on the surface of the component support portion of the tray body and has adhesive force.
本發明的被加工物之加工方法,係將晶片容納於該搬送托盤的被加工物之加工方法,其特徵為具備:加工步驟,將被加工物進行加工而形成多個晶片;容納步驟,將該多個晶片容納於該搬送托盤;判別步驟,以攝像手段拍攝該識別標記,並判別該搬送托盤是否為可寫入該記錄媒體的種類;及記錄步驟,在判定該搬送托盤的種類為可寫入的種類時,將該加工步驟中的資訊記錄於該記錄媒體。The processing method of a workpiece of the present invention is a processing method of a workpiece that accommodates wafers on the transfer tray, and is characterized by comprising: a processing step of processing the workpiece to form a plurality of wafers; and an accommodation step of processing the workpiece into a plurality of wafers; The plurality of wafers are accommodated in the transfer tray; the determination step is to capture the identification mark with a camera and determine whether the transfer tray is of a type that can be written into the recording medium; and the recording step is to determine whether the transfer tray is of a type that can be written to. In the writing type, the information in the processing step is recorded on the recording medium.
在該被加工物之加工方法中,該搬送托盤亦可具備黏著層,該黏著層裝設於該托盤本體的元件支撐部之表面並具有黏著力。In the processing method of the workpiece, the transfer pallet may also be provided with an adhesive layer. The adhesive layer is installed on the surface of the component support part of the pallet body and has adhesive force.
本申請發明發揮下述功效:在搬送托盤為特定種類時,可將資訊寫入記錄媒體。The invention of this application has the following effect: when the transport pallet is of a specific type, information can be written into a recording medium.
針對用以實施本發明的形態(實施方式),參照圖式進行詳細說明。本發明並不限定於以下實施方式所記載的內容。又,以下所記載之構成要件中包含本領域中具有通常知識者可輕易設想的構成、實質上相同的構成。再者,以下所記載的構成可適當組合。又,在不脫離本發明之主旨的範圍內,可進行構成的各種省略、置換或變更。The form (embodiment) for carrying out the present invention will be described in detail with reference to the drawings. The present invention is not limited to the contents described in the following embodiments. In addition, the structural requirements described below include structures that can be easily imagined by a person with ordinary knowledge in the art and substantially the same structures. In addition, the structures described below can be combined appropriately. In addition, various omissions, substitutions, or changes in the structure may be made without departing from the gist of the present invention.
[實施方式1] 根據圖式說明本發明之實施方式1之搬送托盤以及被加工物之加工方法。圖1係顯示實施方式1之搬送托盤的構成例的立體圖。圖2係顯示使用實施方式1之搬送托盤的加工裝置之構成例的立體圖。圖3係顯示圖2所示加工裝置之加工對象的被加工物之一例的立體圖。圖4係顯示圖1所示搬送托盤容納元件晶片之狀態的剖面圖。圖5係顯示實施方式1之被加工物之加工方法的流程的流程圖。圖6係以局部剖面示意性地顯示圖5所示被加工物之加工方法的判別步驟及記錄步驟的圖。[Embodiment 1] A method of processing a transport pallet and a workpiece according to Embodiment 1 of the present invention will be described based on the drawings. FIG. 1 is a perspective view showing a structural example of a transport pallet according to Embodiment 1. FIG. 2 is a perspective view showing a structural example of the processing device using the transport pallet according to Embodiment 1. FIG. 3 is a perspective view showing an example of a workpiece to be processed by the processing apparatus shown in FIG. 2 . FIG. 4 is a cross-sectional view showing a state in which component wafers are accommodated in the transfer tray shown in FIG. 1 . FIG. 5 is a flowchart showing the flow of the processing method of the workpiece according to the first embodiment. FIG. 6 is a diagram schematically showing, in partial cross-section, the identification steps and recording steps of the processing method of the workpiece shown in FIG. 5 .
實施方式1的圖1所示之搬送托盤1係於圖2所示之加工裝置210中使用。圖2所示之加工裝置210係將圖3所示之被加工物200進行切割加工的裝置。如圖3所示,實施方式1的加工裝置210之加工對象的被加工物200形成平面形狀為矩形的平板狀。實施方式1中,如圖3所示,被加工物200為如CSP(Chip Size Package,晶片級封裝)或QFN(Quad Flat Non-leaded package,四方平面無引腳封裝)等以樹脂密封多個半導體晶片所構成的所謂封裝基板。The transport pallet 1 shown in FIG. 1 of Embodiment 1 is used in the processing device 210 shown in FIG. 2 . The processing device 210 shown in FIG. 2 is a device that cuts the workpiece 200 shown in FIG. 3 . As shown in FIG. 3 , the workpiece 200 to be processed by the processing device 210 in Embodiment 1 is formed into a rectangular flat plate shape in plan view. In Embodiment 1, as shown in FIG. 3 , the workpiece 200 is a plurality of packages sealed with resin such as CSP (Chip Size Package, wafer level package) or QFN (Quad Flat Non-leaded package, Quad Flat Non-leaded package). A so-called packaging substrate composed of semiconductor wafers.
各半導體晶片的電極分別與多個凸塊202連接。在被加工物200的表面形成有網格狀的多條分割預定線203,在由分割預定線203所劃分的各區域裝配有半導體晶片。以上述方式所構成的被加工物200係藉由圖2所示之加工裝置210切割分割預定線203而分割成各個元件晶片(相當於申請專利範圍所記載之晶片)204。The electrodes of each semiconductor chip are respectively connected to the plurality of bumps 202 . A plurality of planned dividing lines 203 are formed in a grid shape on the surface of the workpiece 200 , and semiconductor wafers are mounted in each area divided by the planned dividing lines 203 . The workpiece 200 configured in the above manner is divided into individual element wafers (corresponding to the wafers described in the patent application) 204 by cutting the planned dividing lines 203 by the processing device 210 shown in FIG. 2 .
接著,本說明書說明將被加工物200分割成元件晶片204的加工裝置210。加工裝置210係將被加工物200保持於保持台10並沿著多條分割預定線203進行切割加工的裝置。在實施方式1中,加工裝置210係將未黏貼切割膠膜之被加工物200保持於保持台10,並將被加工物200進行所謂的完全切斷而分割成元件晶片204的裝置。Next, this specification describes the processing device 210 that divides the workpiece 200 into element wafers 204. The processing device 210 is a device that holds the workpiece 200 on the holding table 10 and performs cutting processing along a plurality of planned dividing lines 203 . In Embodiment 1, the processing device 210 is a device that holds the workpiece 200 to which a dicing film is not attached on the holding table 10 and performs so-called complete cutting of the workpiece 200 to divide the workpiece 200 into element wafers 204 .
如圖2所示,加工裝置210具備:保持台10,以保持面11吸引保持被加工物200;切割單元20,是以切割刀片21將被吸引保持於保持台10之被加工物200的分割預定線203進行切割而分割的切割手段;及控制單元100。As shown in FIG. 2 , the processing device 210 is provided with: a holding table 10 that attracts and holds a workpiece 200 with a holding surface 11 ; and a cutting unit 20 that uses a cutting blade 21 to divide the workpiece 200 that is attracted and held on the holding table 10 . A cutting means for cutting and dividing the predetermined line 203; and a control unit 100.
保持台10形成為矩形,且具備保持被加工物200的保持面11。保持面11設有:圖中未顯示之吸引口,用以吸引被加工物200及元件晶片204;及圖中未顯示之退避槽,用以使切割刀片21退避。吸引口設於與元件晶片204重疊的位置且在保持面11上開口。退避槽則設於與分割預定線203對應的位置且形成為從保持面11凹陷。The holding table 10 is formed in a rectangular shape and includes a holding surface 11 for holding the workpiece 200 . The holding surface 11 is provided with: a suction opening (not shown in the figure) for attracting the workpiece 200 and the component chip 204; and a retraction groove (not shown in the figure) for retracting the cutting blade 21. The suction port is provided at a position overlapping the element wafer 204 and opens on the holding surface 11 . The escape groove is provided at a position corresponding to the planned dividing line 203 and is formed to be recessed from the holding surface 11 .
保持台10的吸引口與圖中未顯示之真空吸引源連接,吸引口被真空吸引源吸引,藉此將被加工物200吸引、保持於保持面11。又,保持台10設置成藉由圖中未顯示之加工進給單元在X軸方向上移動自如並藉由圖中未顯示之旋轉驅動源繞著與Z軸方向平行的軸心旋轉自如。The suction port of the holding table 10 is connected to a vacuum suction source (not shown in the figure). The suction port is attracted by the vacuum suction source, whereby the workpiece 200 is attracted and held on the holding surface 11 . In addition, the holding table 10 is provided to be freely movable in the X-axis direction by a processing and feeding unit not shown in the figure and to be freely rotatable around an axis parallel to the Z-axis direction by a rotational drive source not shown in the figure.
切割單元20是將被加工物200進行切割的構件。切割單元20具備圖中未顯示之主軸,於其上裝設將保持於保持台10之被加工物200進行切割的切割刀片21。The cutting unit 20 is a member that cuts the workpiece 200 . The cutting unit 20 has a spindle (not shown), and a cutting blade 21 for cutting the workpiece 200 held on the holding table 10 is mounted thereon.
切割刀片21為具有大致環形的極薄之切割磨石。主軸使切割刀片21旋轉,藉此將被加工物200進行切割。主軸容納於主軸外殼22內。切割單元20的主軸及切割刀片21的軸心係設定成與Y軸方向平行。The cutting blade 21 is an extremely thin cutting grindstone having a substantially annular shape. The spindle rotates the cutting blade 21 to cut the workpiece 200 . The spindle is accommodated in the spindle housing 22 . The main axis of the cutting unit 20 and the axis center of the cutting blade 21 are set parallel to the Y-axis direction.
切割單元20係設置成相對於保持台10所保持之被加工物200,藉由圖中未顯示之分度進給單元在Y軸方向上移動自如,且設置成藉由圖中未顯示之切入進給單元在Z軸方向上移動自如。切割單元20可藉由分度進給單元及切入進給單元將切割刀片21定位於保持台10之保持面11的任意位置。切割單元20利用分度進給單元及切入進給單元在Y軸方向及Z軸方向上移動,藉此將利用加工進給單元在X軸方向上移動之保持台10所保持之被加工物200的分割預定線203進行切割,而將被加工物200分割成多個元件晶片204。The cutting unit 20 is arranged to move freely in the Y-axis direction with respect to the workpiece 200 held by the holding table 10 by an indexing feed unit not shown in the figure, and is arranged to cut through an indexing feed unit not shown in the figure. The feeding unit can move freely in the Z-axis direction. The cutting unit 20 can position the cutting blade 21 at any position on the holding surface 11 of the holding table 10 through the indexing feeding unit and the cutting feeding unit. The cutting unit 20 moves in the Y-axis direction and the Z-axis direction using the indexing feed unit and the cutting feed unit, thereby holding the workpiece 200 held by the holding table 10 that moves in the X-axis direction using the processing feed unit. The workpiece 200 is divided into a plurality of element wafers 204 by cutting along the planned division lines 203 .
又,加工裝置210具備:卡匣30,容納多個加工前的被加工物200;搬出單元40,將被加工物200從卡匣30取出;封裝件搬送單元50,將從卡匣30取出的加工前之被加工物200搬送至保持台10;攝像單元60,拍攝加工前的被加工物200而取得用以對準的影像;清洗單元70,將分割成個別的元件晶片204之底面進行清洗;乾燥單元80,使藉由清洗單元70清洗後之元件晶片204乾燥;搬送托盤載置部90,載置用以容納分割成個別之元件晶片204的圖3所示之搬送托盤1;搬送單元110,為搬送手段;及托盤攝像單元120,為攝像手段。In addition, the processing device 210 is provided with: a cassette 30 that accommodates a plurality of processed objects 200 before processing; an unloading unit 40 that takes out the processed objects 200 from the cassette 30; and a package transport unit 50 that takes out the processed objects from the cassette 30. The workpiece 200 before processing is transported to the holding table 10; the camera unit 60 photographs the workpiece 200 before processing to obtain an image for alignment; the cleaning unit 70 cleans the bottom surface of the individual component wafers 204. ; The drying unit 80 dries the component wafer 204 cleaned by the cleaning unit 70 ; the transport tray mounting portion 90 is used to mount the transport tray 1 shown in FIG. 3 for accommodating the divided component wafers 204 ; the transport unit 110, which is a conveying means; and the tray imaging unit 120, which is an imaging means.
卡匣30是容納多片被加工物200的構件。卡匣30中,多片被加工物200在Z軸方向上空開間隔而重疊。卡匣30具備將被加工物200自如地取出與送入的開口31。卡匣30設置成藉由圖中未顯示之卡匣升降機在Z軸方向上升降自如。The cassette 30 is a member that accommodates a plurality of workpieces 200 . In the cassette 30, a plurality of workpieces 200 are overlapped with intervals in the Z-axis direction. The cassette 30 is provided with an opening 31 for freely taking out and feeding the workpiece 200 . The cassette 30 is configured to be freely raised and lowered in the Z-axis direction by a cassette lift (not shown in the figure).
搬出單元40具備:搬出手段41,將1片加工前的被加工物200從卡匣30取出;及一對滑軌42,暫時載置從卡匣30取出之被加工物200。封裝件搬送單元50吸引保持一對滑軌42上的被加工物200,並將所吸引保持之被加工物200搬送至保持台10,載置於保持台10的保持面11。攝像單元60將攝像而得之影像輸出至控制單元100。在實施方式1中,攝像單元60安裝於封裝件搬送單元50上。清洗單元70設於保持台10與搬送托盤載置部90之間。乾燥單元80設於清洗單元70與搬送托盤載置部90之間。The unloading unit 40 is equipped with: an unloading means 41 for taking out one piece of the workpiece 200 before processing from the cassette 30 ; and a pair of slide rails 42 for temporarily placing the workpiece 200 taken out from the cassette 30 . The package transport unit 50 attracts and holds the workpiece 200 on the pair of slide rails 42 , transports the suctioned and held workpiece 200 to the holding table 10 , and places it on the holding surface 11 of the holding table 10 . The camera unit 60 outputs the captured image to the control unit 100 . In Embodiment 1, the imaging unit 60 is attached to the package transport unit 50 . The cleaning unit 70 is provided between the holding table 10 and the transport tray placement part 90 . The drying unit 80 is provided between the cleaning unit 70 and the transport tray mounting part 90 .
於搬送托盤載置部90的上表面91載置搬送托盤1。在實施方式1中,在Y軸方向上空開間隔而設有兩個搬送托盤載置部90。搬送托盤載置部90之上表面91係沿著水平方向形成平坦狀,且形成為大於被加工物200及搬送托盤1的平面形狀。又,搬送托盤載置部90中可堆疊容納多個搬送托盤1,為了將搬送托盤1置於下方,搬送托盤載置部90亦可進一步具備能夠上下移動的升降手段。又,為了取出堆疊的多個搬送托盤1,亦可於裝置的前表面具有與搬送托盤載置部90連接的開關用門。The transport tray 1 is placed on the upper surface 91 of the transport tray placement portion 90 . In Embodiment 1, two transport tray placement parts 90 are provided with a gap in the Y-axis direction. The upper surface 91 of the transport pallet placing part 90 is formed flat along the horizontal direction and is larger than the planar shape of the workpiece 200 and the transport pallet 1 . In addition, a plurality of transport pallets 1 can be stacked and accommodated in the transport pallet mounting section 90. In order to place the transport pallets 1 downward, the transport pallet mounting section 90 may further be equipped with a lifting means capable of moving up and down. Furthermore, in order to take out the stacked plurality of transport pallets 1 , a door for opening and closing connected to the transport tray placement part 90 may be provided on the front surface of the device.
搬送單元110是將切割後的被加工物200、即多個元件晶片204從保持台10搬送至載置於搬送托盤載置部90之上表面91的搬送托盤1上的構件。如圖2所示,搬送單元110具備第1搬送單元111、第2搬送單元112及第3搬送單元113。The transfer unit 110 is a member that transfers the cut workpiece 200 , that is, the plurality of element wafers 204 , from the holding table 10 to the transfer tray 1 placed on the upper surface 91 of the transfer tray placement portion 90 . As shown in FIG. 2 , the transport unit 110 includes a first transport unit 111 , a second transport unit 112 , and a third transport unit 113 .
第1搬送單元111將切割後的被加工物200、即多個元件晶片204從保持台10搬送至清洗單元70。第2搬送單元112將清洗後的被加工物200、即多個元件晶片204從清洗單元70搬送至乾燥單元80。第3搬送單元113將乾燥後的被加工物200、即多個元件晶片204從乾燥單元80搬送至載置於一側搬送托盤載置部90之上表面91的搬送托盤1上。The first transport unit 111 transports the cut workpiece 200 , that is, the plurality of element wafers 204 , from the holding table 10 to the cleaning unit 70 . The second transport unit 112 transports the cleaned workpiece 200 , that is, the plurality of element wafers 204 , from the cleaning unit 70 to the drying unit 80 . The third transport unit 113 transports the dried workpiece 200 , that is, the plurality of element wafers 204 , from the drying unit 80 to the transport tray 1 placed on the upper surface 91 of the one transport tray mounting part 90 .
托盤攝像單元120拍攝容納被加工物200後載置於搬送托盤載置部90之上表面91的搬送托盤1之識別標記(如圖4所示)5,而取得識別標記5的影像。托盤攝像單元120將所取得的影像輸出至控制單元100。在實施方式1中,托盤攝像單元120安裝於第3搬送單元113。The pallet camera unit 120 takes an image of the identification mark (shown in FIG. 4 ) 5 of the transport pallet 1 placed on the upper surface 91 of the transport pallet placement part 90 after accommodating the workpiece 200, and obtains an image of the identification mark 5. The tray camera unit 120 outputs the acquired image to the control unit 100 . In Embodiment 1, the tray imaging unit 120 is attached to the 3rd conveyance unit 113.
載置於搬送托盤載置部90之上表面91的搬送托盤1係用以容納沿著分割預定線203分割被加工物200所形成的多個元件晶片204而進行搬送的構件。如圖1及圖4所示,搬送托盤1具備托盤本體2、黏著層3、記錄媒體4(僅圖4中顯示)及識別標記5(僅圖4中顯示)。The transfer tray 1 placed on the upper surface 91 of the transfer tray placement portion 90 is a member for accommodating and transporting a plurality of element wafers 204 formed by dividing the workpiece 200 along the planned division lines 203 . As shown in FIGS. 1 and 4 , the transport pallet 1 includes a tray body 2 , an adhesive layer 3 , a recording medium 4 (only shown in FIG. 4 ), and an identification mark 5 (only shown in FIG. 4 ).
托盤本體2具備:元件支撐部6,形成平面形狀為矩形的平板狀,由可容納被加工物200之大小的凹部所構成;及框體7,圍繞元件支撐部6的外周而形成。The tray body 2 includes a component support portion 6 formed into a rectangular flat plate shape and composed of a recessed portion large enough to accommodate the workpiece 200; and a frame 7 formed around the outer periphery of the component support portion 6.
元件支撐部6由從搬送托盤1之上表面凹陷的凹部所構成,實施方式1中,其形成比被加工物200的平面形狀更大的矩形。元件支撐部6於底部具有透過黏著層3支撐多個元件晶片204的表面6-1。表面6-1沿著水平方向形成平坦狀。元件支撐部6的表面6-1設定成可一次性容納由被加工物200單體化而成的全部元件晶片204。The component support portion 6 is composed of a recessed portion recessed from the upper surface of the transfer tray 1. In the first embodiment, the component support portion 6 is formed into a rectangle larger than the planar shape of the workpiece 200. The component support part 6 has a surface 6 - 1 at the bottom that supports a plurality of component chips 204 through the adhesive layer 3 . The surface 6-1 is formed flat along the horizontal direction. The surface 6 - 1 of the element support portion 6 is configured to accommodate all the element wafers 204 singulated from the workpiece 200 at one time.
框體7係圍繞著元件支撐部6之表面6-1的外周而形成。黏著層3設於托盤本體2的元件支撐部6之表面6-1,並裝設在元件支撐部6之表面6-1上。黏著層3在元件支撐部6上露出。The frame 7 is formed around the outer periphery of the surface 6 - 1 of the component support portion 6 . The adhesive layer 3 is provided on the surface 6-1 of the component support part 6 of the tray body 2, and is installed on the surface 6-1 of the component support part 6. The adhesive layer 3 is exposed on the element support portion 6 .
黏著層3是具有將多個元件晶片204黏貼的黏貼力(即黏著力)的構件。實施方式1中,黏著層3配置於元件支撐部6的整個表面6-1,並形成一定厚度。黏著層3可由例如新田股份有限公司製的感溫性黏著片Intelimer(註冊商標)膠膜所構成。The adhesive layer 3 is a member having adhesive force (that is, adhesive force) for bonding the plurality of element chips 204 . In Embodiment 1, the adhesive layer 3 is disposed on the entire surface 6-1 of the element support portion 6 and has a certain thickness. The adhesive layer 3 can be composed of, for example, a temperature-sensitive adhesive sheet Intelimer (registered trademark) film manufactured by Nitta Co., Ltd.
記錄媒體4設置於托盤本體2內。實施方式1中,如圖4所示,記錄媒體4埋設於托盤本體2內。記錄媒體4可藉由無線通信從外部寫入資訊,並且記錄藉由無線通信從外部寫入之資訊。記錄媒體4可藉由無線通信從外部讀取已記錄之資訊。在實施方式1中,記錄媒體4為RFID(Radio Frequency identifier,無線射頻識別)標籤,但本發明中並不限定於RFID標籤。The recording medium 4 is installed in the tray body 2 . In Embodiment 1, as shown in FIG. 4 , the recording medium 4 is embedded in the tray body 2 . The recording medium 4 can write information from the outside through wireless communication, and records information written from the outside through wireless communication. The recording medium 4 can read recorded information from the outside through wireless communication. In Embodiment 1, the recording medium 4 is an RFID (Radio Frequency Identifier) tag, but the present invention is not limited to the RFID tag.
識別標記5是識別搬送托盤1是否為可將資訊寫入記錄媒體4的種類之構件。實施方式1中,識別標記5設於框體7上。在實施方式1中,識別標記5係顯示加工裝置210之製造公司的標記,例如,使用顯示加工裝置210之製造公司的註冊商標,但本發明中並不限定於此。識別標記5例如可印刷標記、數字、文字而構成,或亦可由形成於框體7等之凹凸、形成於框體7等之切口等所構成。The identification mark 5 is a member for identifying whether the transport tray 1 is of a type capable of writing information on the recording medium 4 . In Embodiment 1, the identification mark 5 is provided on the frame 7 . In Embodiment 1, the identification mark 5 is a mark indicating the manufacturing company of the processing device 210. For example, a registered trademark of the manufacturing company showing the processing device 210 is used. However, the present invention is not limited to this. The identification mark 5 may be formed by printing marks, numbers, or characters, for example, or may be formed by concavities and convexities formed on the frame 7 or the like, cuts formed on the frame 7 or the like, or the like.
如圖4所示,上述構成的搬送托盤1將被加工物200經切割而單體化之多個元件晶片204黏貼於黏著層3並一次性容納。如此,容納有多個元件晶片204之搬送托盤1係將各元件晶片204黏貼於黏著層3,故可抑制在搬送時容納於元件支撐部6之元件晶片204移動而與其他元件晶片204接觸,導致在元件晶片204的外周發生崩缺,或元件晶片204從元件支撐部6飛出而損壞。又,在實施方式1中,搬送托盤1中,元件支撐部6上未形成將元件晶片204彼此分隔的隔板。As shown in FIG. 4 , the transport pallet 1 having the above structure sticks a plurality of component wafers 204 of the workpiece 200 into individual parts on the adhesive layer 3 and accommodates them all at once. In this way, the transfer tray 1 accommodating a plurality of component wafers 204 has each component wafer 204 adhered to the adhesive layer 3. Therefore, the component wafer 204 accommodated in the component support part 6 can be prevented from moving and contacting other component wafers 204 during transport. As a result, the outer periphery of the element wafer 204 may be chipped, or the element wafer 204 may fly out from the element support part 6 and be damaged. Furthermore, in Embodiment 1, in the transfer tray 1, the component support portion 6 is not provided with a partition that separates the component wafers 204 from each other.
控制單元100分別控制加工裝置210的各構成要件,以使加工裝置210實施對於被加工物200的加工動作。如圖2所示,控制單元100具備記憶手段101、判定手段102及寫入手段103。The control unit 100 controls each component of the processing device 210 so that the processing device 210 performs processing operations on the workpiece 200 . As shown in FIG. 2 , the control unit 100 includes a memory means 101 , a determination means 102 , and a writing means 103 .
記憶手段101儲存識別標記5的影像。實施方式1中,記憶手段101儲存由托盤攝像單元120所拍攝的搬送托盤1之識別標記5的影像。又,實施方式1中,記憶手段101儲存加工內容資訊(相當於下述加工步驟ST1中的資訊),該加工內容資訊係顯示加工裝置210對被加工物200及元件晶片204加工時的條件。The memory means 101 stores the image of the identification mark 5 . In Embodiment 1, the storage means 101 stores the image of the identification mark 5 of the conveyance pallet 1 captured by the pallet imaging unit 120 . Furthermore, in Embodiment 1, the storage means 101 stores processing content information (corresponding to information in processing step ST1 described below) that displays conditions when the processing device 210 processes the object 200 and the element wafer 204 .
判定手段102判別由托盤攝像單元120所拍攝的載置於搬送托盤載置部90之搬送托盤1是否為可將資訊寫入記錄媒體4的種類。實施方式1中,若由托盤攝像單元120所拍攝的載置於搬送托盤載置部90之搬送托盤1的識別標記5之影像與儲存於記憶手段的識別標記5之影像一致,則判定手段102判別載置於搬送托盤載置部90之搬送托盤1為可將資訊寫入記錄媒體4的種類。此外,實施方式1中,判定手段102將由托盤攝像單元120所拍攝的載置於搬送托盤載置部90之搬送托盤1的識別標記5之影像與儲存於記憶手段的識別標記5之影像進行正規化相關(normalized correlation),若相關值為預先設定之預定值以上,則判別影像一致,進而判別載置於搬送托盤載置部90之搬送托盤1為可將資訊寫入記錄媒體4的種類。The determination means 102 determines whether the transport tray 1 placed on the transport tray placement section 90 photographed by the tray imaging unit 120 is of a type in which information can be written into the recording medium 4 . In Embodiment 1, if the image of the identification mark 5 of the transport pallet 1 placed on the transport pallet mounting part 90 captured by the tray imaging unit 120 matches the image of the identification mark 5 stored in the storage means, the determination means 102 It is determined that the transport tray 1 placed on the transport tray placement section 90 is of a type capable of writing information on the recording medium 4 . In addition, in Embodiment 1, the determination means 102 compares the image of the identification mark 5 of the transport pallet 1 mounted on the transport pallet mounting part 90 photographed by the tray imaging unit 120 with the image of the identification mark 5 stored in the memory means. Normalized correlation, if the correlation value is greater than a preset predetermined value, it is determined that the images are consistent, and the transport tray 1 placed on the transport tray placement unit 90 is determined to be of a type that can write information on the recording medium 4 .
又,實施方式1中,判定手段102將由托盤攝像單元120所拍攝的載置於搬送托盤載置部90之搬送托盤1的識別標記5的影像與儲存於記憶手段的識別標記5之影像進行正規化相關,若相關值小於預先設定之預定值,則判別影像不一致,進而判別載置於搬送托盤載置部90之搬送托盤1並非可將資訊寫入記錄媒體4的種類。Furthermore, in Embodiment 1, the determination means 102 compares the image of the identification mark 5 of the transport pallet 1 placed on the transport pallet placement section 90 captured by the tray imaging unit 120 with the image of the identification mark 5 stored in the storage means. If the correlation value is less than a preset predetermined value, it is determined that the images are inconsistent, and further it is determined that the transport tray 1 placed on the transport tray placement section 90 is not of a type that can write information on the recording medium 4 .
若判定手段102判別載置於搬送托盤載置部90之搬送托盤1為可將資訊寫入記錄媒體4的種類,則寫入手段103從記憶手段101讀取顯示對載置於搬送托盤載置部90之搬送托盤1內的元件晶片204加工時之條件的加工內容資訊,並輸出至與控制單元100連接之記錄手段104。If the determination means 102 determines that the transport tray 1 placed on the transport tray placement section 90 is of a type that can write information on the recording medium 4, the writing means 103 reads the information displayed on the transport tray placement section from the memory means 101. The processing content information of the conditions when processing the component wafer 204 in the transfer tray 1 of the unit 90 is output to the recording means 104 connected to the control unit 100 .
記錄手段104將來自寫入手段103之加工內容資訊寫入載置於搬送托盤載置部90之搬送托盤1的記錄媒體4。記錄手段104係由例如習知的RFID標籤讀取器等所構成。The recording means 104 writes the processing content information from the writing means 103 to the recording medium 4 placed on the transport tray 1 of the transport tray placement section 90 . The recording means 104 is composed of, for example, a conventional RFID tag reader.
控制單元100與顯示裝置105及輸入裝置106連接,該顯示裝置105係由顯示諸如加工動作之狀態或影像的液晶顯示裝置等所構成,該輸入裝置106係在操作員登錄加工內容資訊等時使用。輸入裝置106係由設於顯示裝置105之觸控面板及鍵盤等的外部輸入裝置107所構成。The control unit 100 is connected to a display device 105, which is composed of a liquid crystal display device that displays the status or image of the processing operation, and an input device 106, which is used when the operator registers processing content information, etc. . The input device 106 is composed of an external input device 107 such as a touch panel and a keyboard provided on the display device 105 .
此外,控制單元100係具有下述構件的電腦:運算處理裝置,具有如CPU(central processing unit,中央處理單元)等的微處理器;記憶裝置,具有如ROM(read only memory,唯讀記憶體)或RAM(random access memory,隨機存取記憶體)等的記憶體;及輸入輸出界面裝置。控制單元100的運算處理裝置依照記憶裝置所儲存的電腦程式實施運算處理,透過輸入輸出界面裝置將用以控制加工裝置210的控制信號輸出至加工裝置210的上述構成要件。In addition, the control unit 100 is a computer having the following components: a computing device, including a microprocessor such as a CPU (central processing unit, central processing unit); a memory device, such as a ROM (read only memory, read-only memory) ) or RAM (random access memory, random access memory) and other memories; and input and output interface devices. The arithmetic processing device of the control unit 100 performs arithmetic processing according to the computer program stored in the memory device, and outputs the control signal for controlling the processing device 210 to the above-mentioned components of the processing device 210 through the input and output interface device.
記憶手段101的功能可藉由以記憶裝置儲存加工內容資訊及識別標記5的影像來實現。判定手段102及寫入手段103的功能可藉由以運算處理裝置依照記憶裝置所儲存的電腦程式實施運算處理來實現。The function of the memory means 101 can be realized by storing the processing content information and the image of the identification mark 5 in the memory device. The functions of the determining means 102 and the writing means 103 can be realized by using the arithmetic processing device to perform arithmetic processing according to the computer program stored in the memory device.
接著,說明實施方式1所述之加工裝置210的加工動作。操作員將切割加工前的被加工物200容納於卡匣30內,並將搬送托盤1載置於搬送托盤載置部90,操作輸入裝置106來將加工內容資訊登錄於控制單元100。若控制單元100收到來自操作員的加工動作開始指示,則加工裝置210開始加工動作。加工動作中,控制單元100對卡匣30內的被加工物200依序實施圖5所示的被加工物之加工方法。Next, the processing operation of the processing device 210 according to Embodiment 1 will be described. The operator accommodates the workpiece 200 before cutting processing in the cassette 30 , places the transport pallet 1 on the transport tray placement part 90 , and operates the input device 106 to register the processing content information in the control unit 100 . When the control unit 100 receives a processing operation start instruction from the operator, the processing device 210 starts the processing operation. During the processing operation, the control unit 100 sequentially executes the processing method of the workpiece 200 shown in FIG. 5 on the workpiece 200 in the cassette 30 .
被加工物之加工方法係將元件晶片204容納於搬送托盤1的方法,如圖5所示,其具備加工步驟ST1、容納步驟ST2、判別步驟ST3及記錄步驟ST4。加工步驟ST1係將被加工物200進行切割加工而形成多個元件晶片204的步驟。加工步驟ST1中,加工裝置210使搬出單元40從卡匣30取出1片被加工物200,並使封裝件搬送單元50將被加工物200從滑軌42上搬送至保持台10。加工步驟ST1中,加工裝置210使真空吸引源將被加工物200吸引保持於保持台10的保持面11,藉由加工進給單元使保持台10朝向攝像單元60的下方移動,並使攝像單元60拍攝被加工物200,實行對準。The processing method of the workpiece is a method of accommodating the element wafer 204 on the transfer tray 1. As shown in FIG. 5, it includes a processing step ST1, an accommodating step ST2, a determining step ST3, and a recording step ST4. The processing step ST1 is a step of cutting the workpiece 200 to form a plurality of element wafers 204 . In the processing step ST1 , the processing device 210 causes the unloading unit 40 to take out one workpiece 200 from the cassette 30 , and causes the package transport unit 50 to transport the workpiece 200 from the slide rail 42 to the holding table 10 . In the processing step ST1, the processing device 210 uses the vacuum suction source to attract and hold the workpiece 200 on the holding surface 11 of the holding table 10, moves the holding table 10 toward the bottom of the imaging unit 60 by the processing feeding unit, and moves the imaging unit 60 shoots the object to be processed 200 and performs alignment.
加工步驟ST1中,加工裝置210根據加工內容資訊,一邊藉由加工進給單元、分度進給單元、切入進給單元及旋轉驅動源使切割單元20與保持台10沿著分割預定線203相對移動,一邊使切割刀片21切入分割預定線203直至到達退避槽,以將分割預定線203切斷。In the processing step ST1, the processing device 210 uses the processing feed unit, the indexing feed unit, the cutting feed unit and the rotation drive source to make the cutting unit 20 and the holding table 10 face each other along the planned division line 203 according to the processing content information. While moving, the cutting blade 21 cuts into the planned dividing line 203 until it reaches the escape groove, thereby cutting the planned dividing line 203 .
加工步驟ST1中,加工裝置210於切割刀片21將全部分割預定線203切斷後,在使保持台10吸引保持元件晶片204的狀態下,使保持台10上的元件晶片204吸引保持於第1搬送單元111。加工裝置210解除保持台10的吸引保持,將吸引保持於第1搬送單元111之元件晶片204一次性搬送至清洗單元70。In the processing step ST1, after the dicing blade 21 cuts all the planned dividing lines 203, the processing device 210 causes the component wafer 204 on the holding table 10 to be suctioned and held by the holding table 10 in the first conveyance state. Unit 111. The processing device 210 releases the suction and holding of the holding table 10 and transports the component wafer 204 held by suction and suction in the first transfer unit 111 to the cleaning unit 70 at once.
加工步驟ST1中,加工裝置210於清洗單元70中清洗元件晶片204後,使清洗後的元件晶片204吸引保持於第2搬送單元112,並搬送至乾燥單元80。加工裝置210於乾燥單元80中使元件晶片204乾燥後,進入容納步驟ST2。In the processing step ST1 , after the processing device 210 cleans the component wafer 204 in the cleaning unit 70 , the cleaned component wafer 204 is sucked and held in the second transport unit 112 and transported to the drying unit 80 . After drying the device wafer 204 in the drying unit 80, the processing device 210 proceeds to the accommodation step ST2.
容納步驟ST2係將多個元件晶片204容納於搬送托盤1的步驟。容納步驟ST2中,加工裝置210使切割、清洗及乾燥後的元件晶片204吸引保持於第3搬送單元113,並搬送至載置於搬送托盤載置部90之搬送托盤1。The accommodating step ST2 is a step of accommodating the plurality of element wafers 204 on the transfer tray 1 . In the accommodation step ST2, the processing device 210 suctions and holds the cut, cleaned and dried element wafer 204 in the third transport unit 113, and transports it to the transport tray 1 placed on the transport tray placement section 90.
容納步驟ST2中,加工裝置210將吸引保持於第3搬送單元113之元件晶片204推抵於搬送托盤1的黏著層3,使元件晶片204接著於黏著層3後,解除第3搬送單元113的吸引保持,進入判別步驟ST3。In the accommodating step ST2, the processing device 210 pushes the component wafer 204 held by the third transport unit 113 against the adhesive layer 3 of the transport tray 1, so that the component wafer 204 is adhered to the adhesive layer 3, and then releases the third transport unit 113. The attraction is maintained and the judgment step ST3 is entered.
判別步驟ST3係以托盤攝像單元120拍攝載置於搬送托盤載置部90且容納有多個元件晶片204之搬送托盤1的識別標記5,並判別搬送托盤1是否為可寫入記錄媒體4之種類的步驟。在實施方式1中,判別步驟ST3中,如圖6所示,加工裝置210以托盤攝像單元120拍攝載置於搬送托盤載置部90且容納有多個元件晶片204之搬送托盤1的識別標記5。加工裝置210中,判定手段102判別由托盤攝像單元120所拍攝的載置於搬送托盤載置部90之搬送托盤1的識別標記5之影像與儲存於記憶手段的識別標記5之影像是否一致,若判別為一致,則判別載置於搬送托盤載置部90之搬送托盤1為可將資訊寫入記錄媒體4的種類,並進入記錄步驟ST4。The determination step ST3 is to use the tray camera unit 120 to capture the identification mark 5 of the transport tray 1 which is placed on the transport tray placement section 90 and accommodates a plurality of component wafers 204, and to determine whether the transport tray 1 is a writable recording medium 4 Kinds of steps. In Embodiment 1, in the determination step ST3, as shown in FIG. 6 , the processing device 210 uses the tray imaging unit 120 to capture the identification mark of the transfer tray 1 placed on the transfer tray mounting portion 90 and accommodating the plurality of component wafers 204. 5. In the processing device 210, the determination means 102 determines whether the image of the identification mark 5 of the transport pallet 1 placed on the transport pallet mounting part 90 photographed by the tray camera unit 120 matches the image of the identification mark 5 stored in the memory means. If it is determined that they match, it is determined that the transport tray 1 placed on the transport tray placement section 90 is of a type capable of writing information on the recording medium 4, and the process proceeds to recording step ST4.
記錄步驟ST4係在判定手段102判定搬送托盤1的種類為可將資訊寫入記錄媒體的種類時,將加工步驟ST1中的加工內容資訊記錄於記錄媒體4的步驟。記錄步驟ST4中,加工裝置210中,寫入手段103從記憶手段101讀取顯示對載置於搬送托盤載置部90之搬送托盤1內的元件晶片204加工時之條件的加工內容資訊,並輸出至與控制單元100連接的記錄手段104。記錄步驟ST4中,加工裝置210中,記錄手段104將來自寫入手段103的加工內容資訊寫入載置於搬送托盤載置部90之搬送托盤1的記錄媒體4,結束被加工物之加工方法。The recording step ST4 is a step of recording the processing content information in the processing step ST1 on the recording medium 4 when the determining means 102 determines that the type of the transport pallet 1 is a type capable of writing information on the recording medium. In the recording step ST4, in the processing device 210, the writing means 103 reads the processing content information indicating the conditions for processing the component wafer 204 placed in the transfer tray 1 of the transfer tray mounting section 90 from the storage means 101, and Output to the recording means 104 connected to the control unit 100. In the recording step ST4, in the processing device 210, the recording means 104 writes the processing content information from the writing means 103 into the recording medium 4 placed on the transport tray 1 of the transport tray placement section 90, and the processing method of the workpiece is completed. .
又,實施方式1所述之被加工物之加工方法,若在判別步驟ST3中,判定手段102判別由托盤攝像單元120所拍攝的載置於搬送托盤載置部90之搬送托盤1的識別標記5之影像與儲存於記憶手段的識別標記5之影像不一致,進而判別載置於搬送托盤載置部90之搬送托盤1並非可將資訊寫入記錄媒體4的種類,則結束。Furthermore, in the processing method of the workpiece described in Embodiment 1, in the determination step ST3, the determination means 102 determines the identification mark of the transport pallet 1 placed on the transport pallet mounting part 90 photographed by the tray imaging unit 120. 5 is inconsistent with the image of the identification mark 5 stored in the memory means, and it is further determined that the transport tray 1 placed on the transport tray placement section 90 is not of a type that can write information on the recording medium 4, and the process ends.
元件晶片204已黏貼於黏著層3之搬送托盤1,由操作員等搬送至下一步驟,在搬送托盤1已被搬送至下一步驟的搬送托盤載置部90中,由操作員等載置新的搬送托盤1。將搬送至下一步驟之搬送托盤1的黏著層3上所黏貼之元件晶片204分別從黏著層3拾取。The component wafer 204 has been pasted on the transport tray 1 of the adhesive layer 3, and is transported to the next step by the operator. The transport tray 1 has been transported to the next step, and is placed in the transport tray mounting part 90 by the operator. New transfer pallet 1. The component chips 204 adhered to the adhesive layer 3 of the transport tray 1 transported to the next step are respectively picked up from the adhesive layer 3 .
加工裝置210將下一被加工物200進行切割加工,並依序將卡匣30內的被加工物200進行切割加工,若將卡匣30內的全部被加工物200切割加工,則結束加工動作。The processing device 210 cuts the next workpiece 200 and cuts the workpieces 200 in the cassette 30 sequentially. If all the workpieces 200 in the cassette 30 are cut, the processing operation ends. .
實施方式1所述之搬送托盤1具備識別是否為可將資訊寫入記錄媒體4之種類的識別標記5,因此藉由取得識別標記5的影像,可判別是否為可將加工內容資訊寫入記錄媒體4的種類。其結果,在搬送托盤1為特定種類時,發揮可將資訊寫入記錄媒體4的效果。The transport pallet 1 according to Embodiment 1 is provided with an identification mark 5 for identifying whether the type of recording medium 4 can be written with information. Therefore, by obtaining an image of the identification mark 5, it can be determined whether the type of recording medium 4 can be written with information on the processing content. Types of media 4. As a result, when the transport tray 1 is of a specific type, information can be written into the recording medium 4 .
又,實施方式1之搬送托盤1具備黏著層3,因此可抑制在搬送時容納於元件支撐部6之元件晶片204移動而與其他元件晶片204接觸,導致在元件晶片204的外周發生崩缺,或元件晶片204從元件支撐部6飛出而損壞。In addition, the transfer tray 1 of Embodiment 1 is provided with the adhesive layer 3, so that the component wafer 204 accommodated in the component support part 6 can be prevented from moving and coming into contact with other component wafers 204 during transport, resulting in chipping on the outer periphery of the component wafer 204. Or the element wafer 204 may fly out from the element support part 6 and be damaged.
實施方式1之被加工物之加工方法具備判別步驟ST3及記錄步驟ST4,其中該判別步驟ST3係以托盤攝像單元120拍攝載置於搬送托盤載置部90且容納有多個元件晶片204之搬送托盤1的識別標記5,並判別搬送托盤1是否為可將資訊寫入記錄媒體4的種類;該記錄步驟ST4係在判定搬送托盤1的種類為可寫入資訊的種類時,將加工步驟ST1中的加工內容資訊記錄於記錄媒體4;因此在搬送托盤1為特定種類時,發揮可將資訊寫入記錄媒體4的效果。The processing method of the workpiece in Embodiment 1 includes a determination step ST3 and a recording step ST4, wherein the determination step ST3 is to use the tray camera unit 120 to photograph the transportation of a plurality of component wafers 204 placed on the transportation tray placement portion 90 The identification mark 5 of the pallet 1 is used to determine whether the transport pallet 1 is of a type in which information can be written on the recording medium 4; in this recording step ST4, when it is determined that the type of the transport pallet 1 is a type in which information can be written, the processing step ST1 The processing content information in is recorded in the recording medium 4; therefore, when the transport pallet 1 is of a specific type, the information can be written into the recording medium 4.
此外,本發明並不限定於上述實施方式。亦即,在不脫離本發明之主旨的範圍內可進行各種變形而實施。此外,實施方式1中,搬送托盤1係元件支撐部6上未形成將元件晶片204彼此分隔之隔板的托盤,但本發明中並不限定於藉由不具有隔板之黏著層3進行保持的托盤,亦可為元件支撐部6上形成有將元件晶片204彼此分隔之隔板的托盤。In addition, the present invention is not limited to the above-described embodiment. That is, various modifications can be made without departing from the gist of the present invention. In addition, in Embodiment 1, the transfer tray 1 is a tray in which no partitions are formed on the component support portion 6 to separate the component wafers 204 from each other. However, the present invention is not limited to being held by the adhesive layer 3 without partitions. The tray may also be a tray in which partitions are formed on the component support part 6 to separate the component chips 204 from each other.
1:搬送托盤 2:托盤本體 3:黏著層 4:記錄媒體 5:識別標記 6:元件支撐部 6-1:表面 7:框體 120:托盤攝像單元(攝像手段) 200:被加工物 204:元件晶片(晶片) ST1:加工步驟 ST2:容納步驟 ST3:判別步驟 ST4:記錄步驟1: Transport pallets 2: Tray body 3: Adhesive layer 4: Recording media 5:Identification mark 6:Component support part 6-1:Surface 7:Frame 120: Tray camera unit (camera means) 200: Processed object 204: Component chip (wafer) ST1: Processing steps ST2: Accommodation step ST3: Discrimination step ST4: Record steps
圖1係顯示實施方式1之搬送托盤的構成例的立體圖。 圖2係顯示使用實施方式1之搬送托盤的加工裝置之構成例的立體圖。 圖3係顯示圖2所示加工裝置之加工對象的被加工物之一例的立體圖。 圖4係顯示圖1所示搬送托盤容納元件晶片之狀態的剖面圖。 圖5係顯示實施方式1之被加工物之加工方法的流程的流程圖。 圖6係以局部剖面示意性地顯示圖5所示被加工物之加工方法的判別步驟及記錄步驟的圖。FIG. 1 is a perspective view showing a structural example of a transport pallet according to Embodiment 1. FIG. 2 is a perspective view showing a structural example of the processing device using the transport pallet according to Embodiment 1. FIG. 3 is a perspective view showing an example of a workpiece to be processed by the processing apparatus shown in FIG. 2 . FIG. 4 is a cross-sectional view showing a state in which component wafers are accommodated in the transfer tray shown in FIG. 1 . FIG. 5 is a flowchart showing the flow of the processing method of the workpiece according to the first embodiment. FIG. 6 is a diagram schematically showing, in partial cross-section, the identification steps and recording steps of the processing method of the workpiece shown in FIG. 5 .
1:搬送托盤 1: Transport pallets
2:托盤本體 2: Tray body
3:黏著層 3: Adhesive layer
4:記錄媒體 4: Recording media
5:識別標記 5:Identification mark
6:元件支撐部 6:Component support part
6-1:表面 6-1:Surface
7:框體 7:Frame
200:被加工物 200: Processed object
204:元件晶片(晶片) 204: Component chip (wafer)
Claims (3)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019-027657 | 2019-02-19 | ||
| JP2019027657A JP7304709B2 (en) | 2019-02-19 | 2019-02-19 | Workpiece processing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW202032695A TW202032695A (en) | 2020-09-01 |
| TWI833901B true TWI833901B (en) | 2024-03-01 |
Family
ID=72126061
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW109104645A TWI833901B (en) | 2019-02-19 | 2020-02-14 | Processing methods of processed objects |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP7304709B2 (en) |
| KR (1) | KR102744455B1 (en) |
| CN (1) | CN111584412B (en) |
| TW (1) | TWI833901B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7692292B2 (en) * | 2021-06-11 | 2025-06-13 | 株式会社ディスコ | TRANSPORT TRAY AND METHOD FOR MANUFACTURING TRANSPORT TRAY |
| JPWO2023068137A1 (en) * | 2021-10-18 | 2023-04-27 | ||
| TWI814374B (en) * | 2022-05-10 | 2023-09-01 | 鴻勁精密股份有限公司 | Layered tray displacing device and handler |
| KR102718239B1 (en) * | 2024-07-16 | 2024-10-17 | 주식회사 오픈에스지 | Identification management system using vision sensor for semiconductor device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090123257A1 (en) * | 2007-11-12 | 2009-05-14 | National Semiconductor Corporation | Waffle pack |
| KR100946334B1 (en) * | 2008-03-25 | 2010-03-09 | 세크론 주식회사 | Test tray, tray identification device and test handler including the same |
| US8240549B2 (en) * | 2009-07-29 | 2012-08-14 | Macronix International Co., Ltd. | IC package tray embedded RFID |
| JP2017117913A (en) * | 2015-12-24 | 2017-06-29 | 株式会社ディスコ | Chip housing tray |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09188383A (en) * | 1996-01-04 | 1997-07-22 | Toppan Printing Co Ltd | Tray for storing semiconductor parts |
| KR19980084764A (en) * | 1997-05-26 | 1998-12-05 | 윤종용 | Automatic registration device and method |
| JP2000095291A (en) | 1998-09-22 | 2000-04-04 | Hitachi Ltd | Semiconductor chip carrier |
| JP2000103505A (en) * | 1998-09-30 | 2000-04-11 | Sekisui Chem Co Ltd | Pallet control system |
| JP2004284601A (en) | 2003-03-19 | 2004-10-14 | Renesas Technology Corp | Method for transporting and mounting semiconductor device, method for packaging, and method for reusing container used therein |
| US20040238623A1 (en) | 2003-05-09 | 2004-12-02 | Wayne Asp | Component handling device having a film insert molded RFID tag |
| JP4551823B2 (en) * | 2005-06-08 | 2010-09-29 | 株式会社東芝 | Electronic component tray identification method |
| JP2007128128A (en) * | 2005-11-01 | 2007-05-24 | Hitachi Systems & Services Ltd | Work flow management system |
| KR100792731B1 (en) | 2006-05-12 | 2008-01-08 | 미래산업 주식회사 | Test tray recognition device of semiconductor device test handler |
| JP2008040810A (en) | 2006-08-07 | 2008-02-21 | Shin Etsu Polymer Co Ltd | Molded product for RFID system |
| JP2009110130A (en) * | 2007-10-29 | 2009-05-21 | Hitachi Omron Terminal Solutions Corp | Non-contact IC reader / writer |
| JP2009130045A (en) | 2007-11-21 | 2009-06-11 | Renesas Technology Corp | Wafer control system |
| CN102640253B (en) | 2010-10-04 | 2014-06-18 | 晟碟半导体(上海)有限公司 | Discrete component backward traceability and semiconductor device forward traceability |
| JP5690615B2 (en) | 2011-03-03 | 2015-03-25 | リンテック株式会社 | Ring frame and process management system |
| JP5685128B2 (en) * | 2011-04-05 | 2015-03-18 | 富士機械製造株式会社 | Pallet type determination system |
| US9545724B2 (en) * | 2013-03-14 | 2017-01-17 | Brooks Automation, Inc. | Tray engine with slide attached to an end effector base |
| JP2019014488A (en) | 2017-07-04 | 2019-01-31 | 信越ポリマー株式会社 | Tray for electronic components and manufacturing method of the same |
| CN108529194A (en) * | 2018-03-30 | 2018-09-14 | 深圳市艾特讯科技有限公司 | A kind of charging tray carrying method, system and terminal device |
-
2019
- 2019-02-19 JP JP2019027657A patent/JP7304709B2/en active Active
-
2020
- 2020-01-30 KR KR1020200011281A patent/KR102744455B1/en active Active
- 2020-02-14 TW TW109104645A patent/TWI833901B/en active
- 2020-02-17 CN CN202010095644.9A patent/CN111584412B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090123257A1 (en) * | 2007-11-12 | 2009-05-14 | National Semiconductor Corporation | Waffle pack |
| KR100946334B1 (en) * | 2008-03-25 | 2010-03-09 | 세크론 주식회사 | Test tray, tray identification device and test handler including the same |
| US8240549B2 (en) * | 2009-07-29 | 2012-08-14 | Macronix International Co., Ltd. | IC package tray embedded RFID |
| JP2017117913A (en) * | 2015-12-24 | 2017-06-29 | 株式会社ディスコ | Chip housing tray |
Also Published As
| Publication number | Publication date |
|---|---|
| KR102744455B1 (en) | 2024-12-18 |
| CN111584412A (en) | 2020-08-25 |
| JP2020136481A (en) | 2020-08-31 |
| JP7304709B2 (en) | 2023-07-07 |
| KR20200101284A (en) | 2020-08-27 |
| CN111584412B (en) | 2025-11-07 |
| TW202032695A (en) | 2020-09-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI833901B (en) | Processing methods of processed objects | |
| JP2539447B2 (en) | Production method by single-wafer carrier | |
| JP2003197581A (en) | Plate-like support member and method of using the same | |
| JP2004207606A (en) | Wafer support plate | |
| JP2008290170A (en) | Semiconductor device manufacturing method | |
| KR20200021537A (en) | Conveying apparatus, substrate processing system, conveying method and substrate processing method | |
| JP2021170659A (en) | Board processing system and board processing method | |
| JP4846411B2 (en) | Semiconductor package jig | |
| JP2001176892A (en) | Die-bonding method and device thereof | |
| CN107068606A (en) | Processing unit (plant) | |
| JP7285669B2 (en) | processing equipment | |
| CN105914164B (en) | Processing device | |
| JP6044986B2 (en) | Cutting equipment | |
| JP2000299297A (en) | Pellet pickup table and pellet transfer device | |
| JP2002353170A (en) | Semiconductor wafer separation system, separation method and dicing apparatus | |
| JP2017069370A (en) | Transport mechanism | |
| JP7308621B2 (en) | Conveyor | |
| TWI813825B (en) | Processing device | |
| CN110943025B (en) | Conveying unit and conveying method | |
| TWI887451B (en) | Processing object management method and thin-film cutting device | |
| TW202412155A (en) | Mounting method and cutting apparatus | |
| TW202123372A (en) | Processing device capable of suppressing decrease of processing efficiency | |
| TW202439418A (en) | Cutting blade storage device | |
| TW202533308A (en) | Processing method and processing device for workpiece | |
| CN116895558A (en) | Processing device |