TWI451064B - Laser displacement measuring device and method combined with image measuring instrument - Google Patents

Laser displacement measuring device and method combined with image measuring instrument Download PDF

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TWI451064B
TWI451064B TW100114219A TW100114219A TWI451064B TW I451064 B TWI451064 B TW I451064B TW 100114219 A TW100114219 A TW 100114219A TW 100114219 A TW100114219 A TW 100114219A TW I451064 B TWI451064 B TW I451064B
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mirror
measuring instrument
laser displacement
photodetector
information processing
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TW201243270A (en
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Lih Horng Shyu
Yu Fen Fu
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Univ Nat Formosa
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結合影像量測儀的雷射位移量測裝置及方法Laser displacement measuring device and method combined with image measuring instrument

本發明係有關雷射位移量測裝置及方法,尤其是結合影像量測儀的雷射位移量測裝置及方法。The invention relates to a laser displacement measuring device and method, in particular to a laser displacement measuring device and method combined with an image measuring instrument.

目前的科技日新月異,對產品的規格有較高的要求,以至於近年來廠商致力於提升精密量測的能力,使精度及檢測技術的手段跟著提高。The current technology is changing with each passing day, and the specifications of the products are highly demanded. In recent years, the manufacturers have been working hard to improve the precision measurement capability, and the means of precision and detection technology have been improved.

幾何尺寸的量測是品管與品質的重要手段,而傳統的位移和表面形貌的量測多為接觸式的探針檢測,有下列的缺點:The measurement of geometrical dimensions is an important means of quality control and quality. The traditional measurement of displacement and surface topography is mostly contact probe detection, which has the following disadvantages:

(1) 接觸時將使被量測的工件變形,特別是軟質或易損傷的表面;(1) The workpiece to be measured will be deformed during contact, especially a soft or vulnerable surface;

(2) 探針容易磨損;(2) The probe is prone to wear;

(3) 存在接觸式的濾波效應。(3) There is a contact filtering effect.

傳統的影像量測儀主要是應用於平面量測,只能檢測物體的二維(2D)形狀,無法量測物體的高度和深度。The traditional image measuring instrument is mainly used for plane measurement, and can only detect the two-dimensional (2D) shape of an object, and cannot measure the height and depth of the object.

如圖1所示,傳統的三角量測是讓雷射模組10射出的雷射光11投射在待測物2上顯示一光點A,然後散射形成一個能量分佈的光錐,經透鏡12成像於光檢測器13上。光檢測器13可為位置檢測元件(PSD)、CMOS光檢測器或電荷耦合式感測器(CCD)。由幾何光學可知,若待測物2移動一段距離Δd時,在光檢測器13上對應的光斑也隨之位移一段距離x,例如待測物2往其上方移動距離Δd,則光點位置由光點A移動至光點B,對應的光斑的位置由光斑A’移動至光斑B’位置,光斑移動距離x與待測物2移動距離Δd之間有一特定關係,這也是三角量測的基本原理。三角量測從原理上進行分類大致可分為散射式及反射式。三角量測在檢測架構上大致可分類成直射式及斜射式。As shown in FIG. 1 , the conventional triangulation measurement is such that the laser light 11 emitted from the laser module 10 is projected on the object to be tested 2 to display a light spot A, and then scattered to form an energy distribution light cone, which is imaged by the lens 12 . On the photodetector 13. The photodetector 13 can be a position detecting element (PSD), a CMOS photodetector, or a charge coupled sensor (CCD). It can be seen from the geometrical optics that if the object 2 is moved by a distance Δd, the corresponding spot on the photodetector 13 is also displaced by a distance x, for example, the object 2 is moved upward by a distance Δd, and the spot position is The spot A moves to the spot B, and the position of the corresponding spot moves from the spot A' to the spot B' position, and there is a specific relationship between the spot moving distance x and the moving distance Δd of the object to be tested 2, which is also the basic of the triangular measurement. principle. The triangulation measurement can be classified into a scattering type and a reflection type in principle. Triangulation can be roughly classified into direct and oblique types on the detection architecture.

如圖1所示,直射式三角量測的架構,係雷射模組10射出的雷射光11分別投射於待測物2而顯示一光點A、投射於待測物2往其上方移動距離Δd的位置而顯示一光點B、投射於待測物2往其下方移動距離Δd的位置而顯示一光點C,該等投射位置皆與雷射模組10射出的雷射光11的投射光軸重合,而在光檢測器13上分別產生對應的光斑A’、光斑B’及光斑C’,這也是最常見的架構。此一架構的光點A、光點B及光點C係待測物2上的同一量測位置。As shown in FIG. 1 , the direct-radiation measurement system is configured such that the laser light 11 emitted from the laser module 10 is projected on the object to be tested 2 to display a light spot A and projected on the object to be tested 2 to move upward. a position of Δd is displayed, a spot B is projected, and a position of the object to be tested 2 is moved downward by a distance Δd to display a spot C, which is projected with the laser beam 11 emitted by the laser module 10 The axes coincide and the corresponding spot A', spot B' and spot C' are respectively produced on the photodetector 13, which is also the most common architecture. The light spot A, the light spot B, and the light spot C of this structure are the same measurement positions on the object 2 to be tested.

如圖2所示,斜射式三角量測的架構,係雷射模組10射出的雷射光11分別以同一傾斜角度,投射於待測物2而顯示一光點A、投射於待測物2往其上方移動距離Δd的位置而顯示一光點B、投射於待測物2往其下方移動距離Δd的位置而顯示一光點C,而在光檢測器13上分別產生對應的光斑A’、光斑B’及光斑C’。此一架構的光點A、光點B及光點C分別是待測物2上不同的位置。當待測物2移動一段距離Δd時,投射在待測物2的光點位置會隨著改變,與原先的量測位置之間有橫向的位移,因而產生量測的誤差。As shown in FIG. 2, the oblique triangular measurement architecture is such that the laser light 11 emitted from the laser module 10 is projected onto the object to be tested at the same tilt angle to display a spot A and is projected on the object to be tested 2 Moving to a position above the distance Δd to display a light spot B, projecting a position of the object 2 to be moved downward by a distance Δd to display a light spot C, and respectively generating a corresponding spot A on the photodetector 13 , spot B' and spot C'. The light spot A, the light spot B, and the light spot C of this structure are different positions on the object 2 to be tested, respectively. When the object 2 is moved by a distance Δd, the position of the spot projected on the object to be tested 2 changes with the lateral displacement between the original measurement position, thus causing a measurement error.

台灣專利第I279522號揭示一種位移計測方法以及位移感測器,第I292814號揭示一種位移計及位移測定方法,第I278598號揭示一種三維形狀計測裝置。上述專利分別揭示利用雷射光及位置檢測元件(PSD)的量測技術,但未揭示有結合影像量測儀進行量測的相關技術。Taiwan Patent No. I279522 discloses a displacement measuring method and a displacement sensor. No. I292814 discloses a displacement meter and a displacement measuring method, and No. I278598 discloses a three-dimensional shape measuring device. The above patents disclose measurement techniques using laser light and position detecting elements (PSD), respectively, but do not disclose related techniques for measuring with a combined image measuring instrument.

為了進一步改良已知利用雷射光及光檢測器的三角量測裝置及方法,而提出本發明。The present invention has been proposed in order to further improve a triangular measuring device and method which are known to utilize laser light and photodetectors.

本發明的主要目的,在提供一種結合影像量測儀的雷射位移量測裝置及方法,以提升雷射位移量測裝置的精密量測能力。The main object of the present invention is to provide a laser displacement measuring device and method combining the image measuring instrument to improve the precision measuring capability of the laser displacement measuring device.

本發明的另一目的,在提供一種結合影像量測儀的雷射位移量測裝置及方法,將三角量測法與影像量測儀結合,可量測待測物的高度、深度及表面形貌。Another object of the present invention is to provide a laser displacement measuring device and method combined with an image measuring instrument, which combines a triangulation method with an image measuring instrument to measure the height, depth and surface shape of the object to be tested. appearance.

本發明的其他目的、功效,請參閱圖式及實施例,詳細說明如下。For other purposes and functions of the present invention, please refer to the drawings and the embodiments, which are described in detail below.

本發明採用非接觸式量測的觀念發展系統,將三角量測法與影像量測儀結合,可量測待測物的高度、深度及表面形貌。但這兩系統在光路上相衝突,為解決此一問題,本發明將雷射光改為斜向入射使光路錯開,但考慮到位移時量測點的位置可能改變,因此利用影像量測儀來監測觀測點的位置,並回授控制斜向的入射角度以確保在待測物上的觀測點與量測點是同一點。The invention adopts the concept development system of non-contact measurement, combines the triangulation method with the image measuring instrument, and can measure the height, depth and surface topography of the object to be tested. However, the two systems collide on the optical path. To solve this problem, the present invention changes the laser light to oblique incidence to make the optical path staggered, but the position of the measurement point may change in consideration of the displacement, so the image measuring instrument is used. Monitor the position of the observation point and feedback the angle of incidence to control the oblique direction to ensure that the observation point on the object to be tested is the same point as the measurement point.

如圖3所示,本發明結合影像量測儀的雷射位移量測裝置1,包括雷射模組10、透鏡12、光檢測器13、反射鏡14、影像量測儀15及資訊處理單元16所組成。資訊處理單元16電氣連結光檢測器13及影像量測儀15。本發明的光檢測器13可為位置檢測元件(PSD)、CMOS光檢測器或電荷耦合式感測器(CCD);反射鏡14可結合一動力單元141,動力單元141帶動反射鏡14變更鏡面的角度,動力單元141可為一馬達、微機電元件、使鏡面轉動的裝置或為一般的掃描鏡裝置;資訊處理單元16可為電子電路、微處理器或電腦。As shown in FIG. 3, the laser displacement measuring device 1 of the present invention combined with an image measuring instrument comprises a laser module 10, a lens 12, a photodetector 13, a mirror 14, an image measuring instrument 15 and an information processing unit. 16 components. The information processing unit 16 electrically connects the photodetector 13 and the image measuring instrument 15. The photodetector 13 of the present invention may be a position detecting element (PSD), a CMOS photodetector or a charge coupled sensor (CCD); the mirror 14 may be combined with a power unit 141, and the power unit 141 drives the mirror 14 to change the mirror surface. The power unit 141 can be a motor, a microelectromechanical component, a device that rotates the mirror, or a general scanning mirror device; the information processing unit 16 can be an electronic circuit, a microprocessor, or a computer.

如圖4、5所示,位置檢測元件(PSD)30的構造,包括一底層31為N層,一中間層32是高阻阬的基板I層及一最上層33是P層;A、B是P層上面的兩個端電極。位置檢測元件30的表面被光束照射後會產生電子及電洞對;如果I層受到雷射光的照射後產生光生載流子,這些電子及電洞對到達電極接合處的數量(電流大小)與光點入射位置和到達電極的距離成反比關係,如此電流值就可以對應出入射光點的位置。其中光點照射位置為Q,而P層上的電極以A,B表示之,N層的電極為C。As shown in FIGS. 4 and 5, the position detecting element (PSD) 30 has a structure in which a bottom layer 31 is an N layer, an intermediate layer 32 is a high-resistance substrate I layer, and an uppermost layer 33 is a P layer; A, B It is the two terminal electrodes above the P layer. The surface of the position detecting element 30 is irradiated with a light beam to generate an electron and a hole pair; if the I layer is irradiated with laser light to generate photogenerated carriers, the number of electrons and holes reaching the electrode joint (current magnitude) and The incident position of the light spot is inversely proportional to the distance to the electrode, so that the current value can correspond to the position of the incident light spot. The spot irradiation position is Q, and the electrodes on the P layer are denoted by A, B, and the electrodes of the N layer are C.

圖5為圖4的等效電路模型,電極A與電極B的中點到Q點的距離為X。電極A到電極B的距離為L,電流分別為Ia 及Ib ,兩端之間的阻阬為RS ,ρ為電阻係數,A為半導體的截面積,則可表示如下:FIG. 5 is an equivalent circuit model of FIG. 4, and the distance from the midpoint of the electrode A to the electrode B to the Q point is X. The distance from electrode A to electrode B is L, the current is I a and I b respectively , the resistance between the two ends is R S , ρ is the resistivity, and A is the cross-sectional area of the semiconductor, which can be expressed as follows:

其中K為一比例常數。Where K is a proportional constant.

由上式可以看出X只與等號右邊的(Ib -Ia )/(Ib +Ia )有關係,和其它參數無關,此一位置為入射光能量的質心位置。只要根據關係式X,適當的設計信號處理電路即可測出光斑的質心位置。It can be seen from the above equation that X is only related to (I b -I a )/(I b +I a ) on the right side of the equal sign, regardless of other parameters, this position is the centroid position of the incident light energy. As long as according to the relationship X, the signal processing circuit can appropriately measure the centroid position of the spot.

如圖3、6所示,本發明採用斜射式三角量測的架構,但利用可轉動式的反射鏡14及影像量測儀15,以克服投射在待測物2的光點位置隨著待測物2的移動而改變,因而產生量測誤差的問題。As shown in FIGS. 3 and 6, the present invention adopts an oblique triangular measurement architecture, but utilizes a rotatable mirror 14 and an image measuring instrument 15 to overcome the position of the light spot projected on the object 2 to be tested. The movement of the object 2 changes, thereby causing a problem of measurement error.

本發明雷射模組10射出的雷射光11經由反射鏡14反射,以一傾斜角度投射於待測物2的量測位置而顯示一光點A,並經由透鏡12成像於光檢測器13,而在光檢測器13上產生一對應的光斑A’,此時影像量測儀15攝取光點A於待測物2上的影像。The laser light 11 emitted from the laser module 10 of the present invention is reflected by the mirror 14 and projected at a measuring position of the object 2 at an oblique angle to display a spot A, and is imaged by the lens 12 to the photodetector 13. A corresponding spot A' is generated on the photodetector 13, and the image measuring instrument 15 picks up the image of the spot A on the object 2 to be tested.

若雷射光11投射的角度不變,當待測物2往其上方或下方移動距離Δd時,影像量測儀15將會攝取,如圖2所示雷射光11投射於待測物2的不同量測位置而顯示的光點B或光點C的影像,而非攝取雷射光11投射於正確量測位置的影像時,利用資訊處理單元16讀取及處理影像量測儀15輸出的影像資訊,確認待測物2上光點的質心位置是否為正確的量測位置,然後經由類比數位轉換單元17輸出控制訊號至掃描鏡裝置,如圖6所示,控制掃描鏡裝置中可轉動式的反射鏡14旋轉其鏡面角度,使雷射光11分別投射於正確的量測位置,即如圖3所示光點B或光點C的位置,再使光檢測器13進行量測,而在光檢測器13上產生對應的光斑B’或光斑C’;類比數位轉換單元17將光檢測器13輸出的訊號傳輸至資訊處理單元16進行處理;資訊處理單元16即可依據光斑B’或光斑C’的位置之資訊計算待測物2的移動距離,進而可量測待測物2的高度、深度及3D形貌。PSD的信號也可用來監測光源的功率,並提供了進一步訊號處理及提升精度的依據。If the angle of the projection of the laser light 11 is constant, when the object 2 is moved upward or downward by a distance Δd, the image measuring instrument 15 will ingest, as shown in FIG. 2, the laser light 11 is projected on the object 2 to be tested. When the image of the light spot B or the light spot C is displayed by measuring the position, instead of the image of the laser light 11 being projected at the correct measurement position, the information processing unit 16 is used to read and process the image information output by the image measuring instrument 15 , confirming whether the centroid position of the spot on the object 2 is the correct measurement position, and then outputting the control signal to the scanning mirror device via the analog-digital conversion unit 17, as shown in FIG. 6, controlling the rotatable type in the scanning mirror device The mirror 14 rotates its mirror angle so that the laser light 11 is respectively projected to the correct measurement position, that is, the position of the light spot B or the light spot C as shown in FIG. 3, and then the photodetector 13 is measured, and A corresponding spot B' or spot C' is generated on the photodetector 13; the analog digital conversion unit 17 transmits the signal output from the photodetector 13 to the information processing unit 16 for processing; the information processing unit 16 can be based on the spot B' or the spot. Information on the location of C' is calculated 2 was moving distance, thereby measuring the amount of analyte can height, depth and morphology of 3D 2. The PSD signal can also be used to monitor the power of the source and provide a basis for further signal processing and improved accuracy.

本發明由影像量測儀15來檢測落在待測物2上的光點位置是否正確,然後控制反射鏡14的鏡面角度來調整雷射光11投射於待測物2上的光點位置,鎖定在正確的位置後再進行量測。本發明經由多次的試驗獲得如圖7所示,位移(Δd)與(Ib -Ia )/(Ib +Ia )的試驗數據與標準差的對應表,及如圖8所示位移(Δd)與(Ib -Ia )/(Ib +Ia )的對應圖示;其中圖7為取樣率1K(擷取頻率100K Hz)每點各抓取50筆數據的平均;圖8中的橫軸為位移距離(mm),縱軸為將PSD兩端輸出訊號做正規化處理,直線為經過曲線擬合結果。由上述試驗數據顯示經過資訊處理後位移(Δd)與(Ib -Ia )/(Ib +Ia )成線性比例的關係,因此可證明本發明利用光檢測器13輸出的訊號計算待測物2的移動距離的可行性。The image measuring instrument 15 detects whether the position of the light spot falling on the object to be tested 2 is correct, and then controls the mirror angle of the mirror 14 to adjust the position of the light spot projected by the laser light 11 on the object to be tested 2, and locks Perform the measurement after the correct position. The present invention obtains a correspondence table between the test data and the standard deviation of the displacement (Δd) and (I b -I a )/(I b +I a ) as shown in FIG. 7 through a plurality of tests, and as shown in FIG. Corresponding diagram of displacement (Δd) and (I b -I a )/(I b +I a ); wherein Figure 7 is the average of 50 data grabs per point for sampling rate 1K (takeout frequency 100K Hz); In Fig. 8, the horizontal axis is the displacement distance (mm), and the vertical axis is to normalize the output signals at both ends of the PSD, and the straight line is the curve fitting result. From the above test data, it is shown that the information processed displacement (Δd) is linearly proportional to (I b -I a )/(I b +I a ), so that the present invention can be proved by the signal outputted by the photodetector 13 The feasibility of measuring the moving distance of the object 2.

如圖9所示,本發明結合影像量測儀的雷射位移量測方法,包括如下步驟:As shown in FIG. 9, the laser displacement measuring method of the present invention combined with the image measuring instrument comprises the following steps:

(1) 使雷射模組射出的雷射光經由可轉動式的反射鏡反射,以一傾斜角度投射於待測物在待測物上顯示一光點,並經由透鏡成像於光檢測器;(1) causing the laser light emitted from the laser module to be reflected by the rotatable mirror, projecting on the object to be tested at an oblique angle to display a spot on the object to be tested, and imaging the photodetector via the lens;

(2) 使影像量測儀攝取該光點在該待測物上的影像資訊,並使資訊處理單元讀取及處理該影像資訊;(2) causing the image measuring instrument to take the image information of the light spot on the object to be tested, and causing the information processing unit to read and process the image information;

(3) 資訊處理單元確認投射於該待測物上的光點是否在正確的量測位置,若不在正確的量測位置則進入步驟(4),若在正確的量測位置則進入步驟(5);(3) The information processing unit confirms whether the spot projected on the object to be tested is at the correct measurement position, if not in the correct measurement position, the process proceeds to step (4), and if it is at the correct measurement position, the process proceeds to the step ( 5);

(4) 使可轉動式的反射鏡旋轉變更鏡面的反射角度,使雷射光以另一傾斜角度投射於待測物,改變光點的位置,然後進入步驟(3);(4) rotating the rotatable mirror to change the reflection angle of the mirror surface, so that the laser light is projected onto the object to be tested at another oblique angle, changing the position of the light spot, and then proceeding to step (3);

(5) 使資訊處理單元讀取及處理該光檢測器輸出的量測訊號,以獲得該量測位置的數值。(5) causing the information processing unit to read and process the measurement signal output by the photodetector to obtain the value of the measurement position.

本發明移動待測物之後,可使反射鏡一直旋轉,而影像量測儀一直輸出攝取影像資訊,光檢測器一直輸出量測訊號;資訊處理單元處理該影像資訊,確認投射於該待測物的光點是在正確的量測位置時,資訊處理單元才讀取及處理該光檢測器輸出的量測訊號,以獲得該量測位置的數值。After moving the object to be tested, the mirror can be rotated all the time, and the image measuring instrument always outputs the captured image information, and the photodetector always outputs the measuring signal; the information processing unit processes the image information to confirm the projection to the object to be tested. The light spot is that the information processing unit reads and processes the measurement signal output by the photodetector at the correct measurement position to obtain the value of the measurement position.

本發明結合影像量測儀的雷射位移量測方法,包括上述記載有關本發明結合影像量測儀的雷射位移量測裝置中的技術內容,不再贅述。The laser displacement measuring method combined with the image measuring instrument of the present invention includes the technical content of the laser displacement measuring device described above in connection with the image measuring instrument of the present invention, and will not be described again.

本發明利用影像量測儀來觀測落在待測物上的光點位置,然後由軟體或韌體計算出待測物上光點的質心位置是否為正確的量測位置,再藉由控制反射鏡的鏡面角度來調整光點的位置,鎖定在正確的位置上後再進行量測,利用類比數位轉換單元將位置檢測元件輸出端的訊號送入資訊處理單元後進行訊號處理,以量測物體的高度和深度及3D形貌。本發明可提升雷射位移量測裝置的精密量測能力。The invention uses an image measuring instrument to observe the position of the light spot falling on the object to be tested, and then calculates whether the centroid position of the light spot on the object to be tested is the correct measuring position by the software or the firmware, and then controls The mirror angle of the mirror adjusts the position of the light spot, locks it at the correct position, and then measures it. The analog digital conversion unit sends the signal of the output of the position detecting component to the information processing unit for signal processing to measure the object. Height and depth and 3D topography. The invention can improve the precision measuring capability of the laser displacement measuring device.

以上所記載者,僅為利用本發明技術內容之實施例,任何熟悉本項技藝者運用本發明所為之修飾、變化,皆屬本創作所主張之專利範圍。The above descriptions are only examples of the use of the technical content of the present invention, and any modifications and variations made by those skilled in the art using the present invention are within the scope of the patent claimed.

1...結合影像量測儀的雷射位移量測裝置1. . . Laser displacement measuring device combined with image measuring instrument

10...雷射模組10. . . Laser module

11...雷射光11. . . laser

12...透鏡12. . . lens

13...光檢測器13. . . Photodetector

14...反射鏡14. . . Reflector

141...動力單元141. . . Power unit

15...影像量測儀15. . . Image measuring instrument

16...資訊處理單元16. . . Information processing unit

17...類比數位轉換單元17. . . Analog digital conversion unit

2...待測物2. . . Analyte

30...位置檢測元件30. . . Position detecting element

31...底層31. . . Bottom layer

32...中間層32. . . middle layer

33...最上層33. . . Peak

(1)、(2)、(3)、(4)、(5)分別為本發明流程圖中的步驟編號(1), (2), (3), (4), (5) are the step numbers in the flowchart of the present invention, respectively.

圖1為直射式三角量測的架構示意圖。Figure 1 is a schematic diagram of the architecture of a direct triangular measurement.

圖2為斜射式三角量測的架構示意圖。Figure 2 is a schematic diagram of the architecture of the oblique triangular measurement.

圖3為本發明結合影像量測儀的雷射位移量測裝置的示意圖。FIG. 3 is a schematic diagram of a laser displacement measuring device combined with an image measuring instrument according to the present invention.

圖4為位置檢測元件的剖面示意圖。4 is a schematic cross-sectional view of a position detecting element.

圖5為位置檢測元件相對應等效電路模型的示意圖。Fig. 5 is a schematic diagram of a corresponding circuit model corresponding to a position detecting element.

圖6為本發明結合影像量測儀的雷射位移量測裝置的工作程序示意圖。FIG. 6 is a schematic diagram showing the working procedure of the laser displacement measuring device combined with the image measuring instrument of the present invention.

圖7為本發明位移(Δd)與(Ib -Ia )/(Ib +Ia )的試驗數據與標準差的對應表。Figure 7 is a correspondence table between test data and standard deviation of displacement (Δd) and (I b -I a )/(I b +I a ) of the present invention.

圖8為本發明位移(Δd)與(Ib -Ia )/(Ib +Ia )的對應圖。Figure 8 is a corresponding diagram of the displacement (Δd) and (I b -I a )/(I b +I a ) of the present invention.

圖9為本發明結合影像量測儀的雷射位移量測方法的流程圖。FIG. 9 is a flow chart of a method for measuring laser displacement in combination with an image measuring instrument according to the present invention.

(1)、(2)、(3)、(4)、(5)分別為本發明流程圖中的步驟編號(1), (2), (3), (4), (5) are the step numbers in the flowchart of the present invention, respectively.

Claims (15)

一種結合影像量測儀的雷射位移量測裝置,包括:一雷射模組;一反射鏡;一透鏡;一光檢測器;一影像量測儀;一資訊處理單元,電氣連結該光檢測器及該影像量測儀;其中該雷射模組用以射出一雷射光經由該反射鏡投射於一待測物,在該待測物上顯示一光點並經由該透鏡成像於該光檢測器;該影像量測儀用以攝取該光點的影像資訊;該資訊處理單元用以讀取及處理該影像資訊,然後確認該光點是否在正確的量測位置;若該光點不在正確的量測位置,則變更該反射鏡的鏡面的角度,使該雷射光投射於正確的量測位置,然後使該資訊處理單元讀取及處理該光檢測器輸出的量測訊號,以獲得該量測位置的數值。A laser displacement measuring device combined with an image measuring instrument, comprising: a laser module; a mirror; a lens; a photodetector; an image measuring instrument; an information processing unit, electrically connecting the light detecting And the image measuring instrument; wherein the laser module emits a laser beam and projects the object to be tested through the mirror, displays a light spot on the object to be tested, and images the light through the lens. The image measuring instrument is configured to capture image information of the light spot; the information processing unit is configured to read and process the image information, and then confirm whether the light spot is in the correct measurement position; if the light spot is not in the correct position Measuring position, changing the angle of the mirror surface of the mirror, causing the laser light to be projected to the correct measurement position, and then causing the information processing unit to read and process the measurement signal output by the photo detector to obtain the The value of the measurement position. 如申請專利範圍第1項所述之結合影像量測儀的雷射位移量測裝置,其中該反射鏡結合一動力單元,該動力單元用以帶動該反射鏡變更鏡面的角度。The laser displacement measuring device combined with the image measuring instrument according to claim 1, wherein the mirror is combined with a power unit for driving the mirror to change the angle of the mirror. 如申請專利範圍第2項所述之結合影像量測儀的雷射位移量測裝置,其中該動力單元為一馬達、微機電元件或使鏡面轉動的裝置其中之一。The laser displacement measuring device according to the second aspect of the invention, wherein the power unit is one of a motor, a microelectromechanical element or a device for rotating a mirror surface. 如申請專利範圍第2項所述之結合影像量測儀的雷射位移量測裝置,其中該動力單元為一掃描鏡裝置。The laser displacement measuring device combined with the image measuring instrument according to claim 2, wherein the power unit is a scanning mirror device. 如申請專利範圍第4項所述之結合影像量測儀的雷射位移量測裝置,其中該資訊處理單元電氣連結一類比數位轉換單元;該類比數位轉換單元電氣連結該光檢測器,俾將該光檢測器輸出的量測訊號傳輸至該資訊處理單元;該類比數位轉換單元電氣連結該掃描鏡裝置,俾將該資訊處理單元控制該反射鏡旋轉鏡面角度的控制訊號傳輸至該掃描鏡裝置。The laser displacement measuring device according to the fourth aspect of the invention, wherein the information processing unit is electrically connected to an analog-to-digital conversion unit; the analog digital conversion unit electrically connects the photodetector, The measurement signal outputted by the photodetector is transmitted to the information processing unit; the analog digital conversion unit electrically connects the scanning mirror device, and transmits a control signal for controlling the mirror rotation angle of the mirror to the scanning mirror device . 如申請專利範圍第1至5項中任一項所述之結合影像量測儀的雷射位移量測裝置,其中該光檢測器為位置檢測元件、CMOS光檢測器或電荷耦合式感測器其中之一;該雷射光係以一傾斜角度投射於該待測物。The laser displacement measuring device combined with the image measuring instrument according to any one of claims 1 to 5, wherein the photodetector is a position detecting element, a CMOS photodetector or a charge coupled sensor One of the laser light is projected onto the object to be tested at an oblique angle. 如申請專利範圍第6項所述之結合影像量測儀的雷射位移量測裝置,其中該資訊處理單元為微處理器、電子電路或電腦其中之一。The laser displacement measuring device combined with the image measuring instrument according to claim 6, wherein the information processing unit is one of a microprocessor, an electronic circuit or a computer. 一種結合影像量測儀的雷射位移量測方法,包括如下步驟:(1)使一雷射模組射出的雷射光經由一反射鏡反射,投射於一待測物在該待測物上顯示一光點,並經由一透鏡成像於一光檢測器;(2)使一影像量測儀攝取該光點在該待測物上的影像資訊,並使一資訊處理單元讀取及處理該影像資訊;(3)該資訊處理單元確認投射於該待測物上的光點是否在正確的量測位置,若不在正確的量測位置則進入步驟(4),若在正確的量測位置則進入步驟(5);(4)變更該反射鏡的鏡面的角度,使雷射光以另一角度投射於該待測物,改變光點的位置,然後進入步驟(3);(5)使該資訊處理單元讀取及處理該光檢測器輸出的量測訊號,以獲得該量測位置的數值。A laser displacement measuring method combined with an image measuring instrument comprises the following steps: (1) causing a laser beam emitted from a laser module to be reflected by a mirror, and projecting on a test object to display on the object to be tested a light spot and imaged by a lens to a photodetector; (2) causing an image measuring instrument to take image information of the light spot on the object to be tested, and causing an information processing unit to read and process the image (3) The information processing unit confirms whether the spot projected on the object to be tested is at the correct measurement position, and if not in the correct measurement position, proceeds to step (4), if at the correct measurement position Going to step (5); (4) changing the angle of the mirror surface of the mirror, causing the laser light to be projected onto the object to be tested at another angle, changing the position of the light spot, and then proceeding to step (3); (5) The information processing unit reads and processes the measurement signal output by the photodetector to obtain the value of the measurement position. 如申請專利範圍第8項所述之結合影像量測儀的雷射位移量測方法,其中步驟(1)的該雷射光係以一傾斜角度投射於該待測物。The laser displacement measuring method of the combined image measuring instrument according to claim 8, wherein the laser light of the step (1) is projected onto the object to be tested at an oblique angle. 如申請專利範圍第9項所述之結合影像量測儀的雷射位移量測方法,其中該反射鏡結合一動力單元,該動力單元用以帶動該反射鏡變更鏡面的角度。The laser displacement measuring method of the combined image measuring instrument according to claim 9, wherein the mirror is combined with a power unit for driving the mirror to change the angle of the mirror. 如申請專利範圍第10項所述之結合影像量測儀的雷射位移量測方法,其中該動力單元為一馬達、微機電元件或使鏡面轉動的裝置其中之一。The laser displacement measuring method of the combined image measuring instrument according to claim 10, wherein the power unit is one of a motor, a microelectromechanical element or a device for rotating the mirror. 如申請專利範圍第10項所述之結合影像量測儀的雷射位移量測方法,其中該動力單元為一掃描鏡裝置。The laser displacement measuring method of the combined image measuring instrument according to claim 10, wherein the power unit is a scanning mirror device. 如申請專利範圍第12項所述之結合影像量測儀的雷射位移量測方法,其中該資訊處理單元電氣連結一類比數位轉換單元;該類比數位轉換單元電氣連結該光檢測器,俾將該光檢測器輸出的量測訊號傳輸至該資訊處理單元;該類比數位轉換單元電氣連結該掃描鏡裝置,俾將該資訊處理單元控制該反射鏡旋轉鏡面角度的控制訊號傳輸至該掃描鏡裝置。The method for measuring a laser displacement of a combined image measuring instrument according to claim 12, wherein the information processing unit is electrically connected to an analog-digital conversion unit; the analog-to-digital conversion unit electrically connects the photodetector, The measurement signal outputted by the photodetector is transmitted to the information processing unit; the analog digital conversion unit electrically connects the scanning mirror device, and transmits a control signal for controlling the mirror rotation angle of the mirror to the scanning mirror device . 如申請專利範圍第8至13項中任一項所述之結合影像量測儀的雷射位移量測方法,其中該光檢測器為位置檢測元件、CMOS光檢測器或電荷耦合式感測器其中之一。The laser displacement measuring method of the combined image measuring instrument according to any one of claims 8 to 13, wherein the photodetector is a position detecting element, a CMOS photodetector or a charge coupled sensor. one of them. 如申請專利範圍第14項所述之結合影像量測儀的雷射位移量測方法,其中該資訊處理單元為微處理器、電子電路或電腦其中之一。The laser displacement measuring method of the combined image measuring instrument according to claim 14, wherein the information processing unit is one of a microprocessor, an electronic circuit or a computer.
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