TWI334067B - Device and method for electronically automatic alignment relative to origin - Google Patents

Device and method for electronically automatic alignment relative to origin Download PDF

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Publication number
TWI334067B
TWI334067B TW96108828A TW96108828A TWI334067B TW I334067 B TWI334067 B TW I334067B TW 96108828 A TW96108828 A TW 96108828A TW 96108828 A TW96108828 A TW 96108828A TW I334067 B TWI334067 B TW I334067B
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Taiwan
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origin
circuit
correction
probe
machine
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TW96108828A
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Chinese (zh)
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TW200837520A (en
Inventor
Ming Da Xie
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Hon Tech Inc
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九、發明說明: -—’ 【發明所屬之技術領域】 LV 2發,尤指其提供—種_導通迴路取樣I作原點的方1, 對原點差量,進而達到精密定位之機i相 【先前技術】 件設備於完雜裝或制—段_後,其可動 ,(如機械手#)由於組裝上的累積公差或元件本身的^ 點工^位可動件之機械原點姉於固定件(如供料匿)各定 =期間後,必須將可動件之機=====用 目前於進行校正時,係先於-以= “移置再 點位置的各軸實際位置卸 T 了動,移動至預故之工作原 生之偏差量:控制 移動至可料即可赠齡財準確的 ^測量可動件移動至職之工作原點位置與校奸 再將的鋼對位置的“量, =式;:預:=置== lllllii:: 的·士,.此外該校正作業亦必須透過人工 I -------—_麵irl 不僅可精準取樣出校正治具上卫作原點之 旨。料从幅改善習式之缺弊,此即為本發明之設計宗 【發明内容】 其方法,台相對原點自動校正裳置及 制單元讀I使該電路形成導通之迴路,再由控 兀再依據該偏差量傳送侖人套 十出偏差夏,控制早 校正治具上工作樣點的方式,即可精準取樣出 而達到精密修正^償之目的。比對出可動件之偏差量,進 校正治具,雜正治具上開設有^作連接有電路之 =:ί 間====;該,;= 置回授所顺各細實際位置^ 作原點位 再依據該偏差 行程式準確的上 之位置’以精確比對 方式,即可獅嫩正離作原點的 1334067 出可動件之偏差旦 本發明之^目轉償之目的。 其方法,其係以自動相對原點自動校正裝置及 預投之工作原點位置進行比對出=士工作原點位置及自動化與 差量傳送命令㈣至每—触 f ’再由蝴單元依據該偏 ,化校正的方式,達到‘定位進行修正補償,進而以自 【實施方式J ^ 實施i並配委明作更進—步之瞭解,兹舉-較佳 於機台件台,原點自動校正裝置,其係 具12,該校正治=戶設-絕緣之校正治 導電針1 3,另於可動杜Ί 點位置裝設底端連接有電路之 針1 5 ;請參閱第2圖,^臂)上裝設連接電路之探 =15移動,並使該探二;之 3時,即可使該電路形点 心、12之導電針1 燈號16,於該電路形成導通之i路時於設一發光 上之探針15已移動 *於=以機台10之χ-γ平面座標位置而言, 度,因此其導相對於固定件11係具有相當之可靠 治具12之工作Μ⑯t/機械原置移動至校正 或元件本身的―裝上的累積公差 作原點位置座標會產W #旦乂 1際之位置座標與預設之工 B位署I f動並接觸至校正治具1 2之導電針1 3之工作t 仏’因此賴餅校正健;首先本發明之校正倾 7 1334067 原點位置之取樣手段,其係利用可動件 ’ 點A位置移動並接觸至校正治具工2之 ^ =^原 工作原點位置進行崎,進而計M f位置後,與預設之 單元再依據該偏差量傳送命令訊;:差f 2制 自動進行修正補償,可動件彳4於铲τ ^件14之母一軸致動器 =正時,相同的亦是於探針1 5接觸ί校正向 工作原點β位置回授所測得ζ轴的^際位ί 迴路之 傳送命令訊號至可制單元再依據該偏差量 =由於係利用導通迴路取樣工作原^3進本 樣出校正治具12上工作肩 其不僅可精準取 1 4之偏差量,且以自動化讀取校=精===可動件 之目的。 仪止進而達到精密定位 請參閲第4圖,本發明另一種 置,其係於機纟2 〇之固定件ϋ口f對原點自動校正裝 電體並連接有電路之校正治具 匣)位置上裝設一為導 工作原點B為中心之凹孔^ 二5▲正治具2 2上開設有以 裝設連接電路之探針2 5 ;請第如機械手臂)上 元驅動可動件24上之探斜 f5圖§機台2〇之控制單 正治具2 2之凹孔2 3左側壁時使#5於接觸校 於該電路村裝設―發 =对騎㈣通之迴路, 時,可利崎光魏2 6和if I於該電路軸導通之迴路 8 1334067 卜,吖日. 針2 5於接觸校正治具2 2之凹孔2 3右側壁時,可 f導通之迴路,並_發光燈號2 6確認可動件2 4上之探/ 5已移動接觸至校正治具!2之凹孔2 3右側壁位置。Nine, invention description: -'' [Technical field of invention] LV 2 hair, especially the one that provides the kind of conduction loop sampling I as the origin of the square 1, the difference of the origin, and then achieve the precise positioning machine i Phase [Prior Art] After the equipment is finished or manufactured, the machine is movable (such as the robot #) due to the cumulative tolerance of the assembly or the mechanical origin of the movable part of the component itself. After fixing the parts (such as the supply of materials) = after the period, the movable part of the machine must be ===== when using the current correction, before the - to = "displace the actual position of each axis of the position T moves, moves to the predecessor's work, the original deviation: control to move to the expected material can give the age of money accurate ^ measure the movable part to move to the job origin position and the schooler's steel position Quantity, = formula;: pre: = set == lllllii:: 士士,. In addition, the calibration work must also be through the artificial I ------- - _ surface irl not only can accurately sample the correction jig guard The purpose of the origin. It is the design of the invention to improve the practice. This is the design of the invention. [Invention] The method is to automatically correct the skirt and the unit read I relative to the origin to make the circuit form a conduction loop, and then control the loop. According to the deviation amount, the method of controlling the working point of the fixture on the fixture can be accurately sampled and the precision correction can be achieved. Compare the deviation of the movable part into the correction fixture, and set up the circuit with the ^^^===================================================================== The original point is then based on the exact position of the deviation stroke type. In the exact comparison mode, the deviation of the movable part from the origin of the lion is 1334067. The method is that the automatic relative to the origin automatic correction device and the pre-injection work origin position are compared to the = work origin position and the automatic and differential transmission command (4) to each touch f 'by the butterfly unit The method of partial correction and correction achieves the 'positioning correction compensation, and further understands from the implementation of the implementation method and the implementation of the committee, and it is better to know the machine table, the origin. The automatic calibration device has a tie 12, the correction treatment = the household-insulation correction treatment conductive pin 13 3, and the bottom end of the movable cuckoo point is connected with the circuit pin 15; see Figure 2, ^ Arm) is installed with the connection circuit probe = 15 movement, and the probe 2; 3, then the circuit-shaped snack, 12 conductive pin 1 signal 16, when the circuit forms a conduction i way The probe 15 for illuminating has been moved* in the sense of the position of the χ-γ plane coordinate of the machine 10, so that the guide has a relatively reliable work of the fixture 12 with respect to the fixing member 11 Μ 16t/ The mechanical original movement to the calibration or the cumulative tolerance of the component itself as the origin position coordinate will be produced W #旦乂1's position coordinates and preset work B position I f move and contact to the correction fixture 1 2 conductive needle 1 3 work t 仏 'so the cake correction; first of all the correction of the invention 7 1334067 The sampling method of the origin position, which uses the movable part 'point A position to move and touches to the original work origin position of the correction fixture 2 ^^^, and then counts the M f position, and presets The unit further transmits the command signal according to the deviation amount; the difference f 2 system automatically performs the correction compensation, and the movable member 彳4 is in the female one-axis actuator of the shovel 14 member = positive timing, and the same is also contacted by the probe 15 ίCorrect feedback to the working origin β position to the measured position of the x-axis ί loop transmission command signal to the unit can be based on the deviation amount = due to the use of the conduction loop sampling work original ^ 3 into the sample correction The working shoulder of the jig 12 can not only accurately take the deviation amount of 1 4, but also automatically read the school = fine === movable member. In order to achieve precise positioning, please refer to FIG. 4, which is another arrangement of the present invention, which is attached to the fixing member of the casing 2, which automatically corrects the charging body to the origin and is connected with the circuit correction tool 匣) The position is provided with a recessed hole centered on the working origin B. 2 5 ▲ Zhengzhi 2 2 is provided with a probe 2 5 for mounting a connecting circuit; please, as the mechanical arm), the upper driving movable member 24 On the slope of the f5 diagram § machine 2 〇 control single Zheng fixture 2 2 recessed hole 2 3 left wall when the #5 in contact with the circuit in the village installation - hair = riding (four) through the loop, when克利崎光魏2 6 and if I in the circuit shaft conduction circuit 8 1334067 卜, the next day. The needle 2 5 is in contact with the correcting fixture 2 2 recessed hole 2 3 right wall, can be turned on the loop, and _LED number 2 6 Confirm that the movable part 2 is on the probe / 5 has moved to the correction fixture! 2 recessed hole 2 3 right wall position.

請參閱第5、6、7圖,以機台2 〇之χ_γ平 言’首先本發明之校正作業係進行 J 置J 動件上之探針2 5於χ轴向移動接:交凹ίPlease refer to Figures 5, 6, and 7 for the machine 2 γ γ 平 ’ ’ 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先 首先

導f之迴路時’控制單元將會記錄該i觸點C f位置座標,接者可動件上之探針2 5於 ^^ C 具之凹孔2 3右側壁而形成導通之迴祕,心正治 位置座標’控制單元將接觸點c、 運鼻並取中間值後可獲致中間點F 季Θ之位置座“ 可動件2 4上之探針2 5於中_ Ε位置===== ,並接觸校正治具之凹孔2 3轴向之移動When the circuit of the f is controlled, the control unit will record the coordinate of the position of the i contact C f, and the probe 2 5 on the movable member of the movable member is formed on the right side wall of the recessed hole 2 3 of the ^^ C to form a conduction back. The Zhengzhi position coordinate 'control unit will contact the point c, the nose and take the middle value to obtain the intermediate point F. The position of the seat is "the probe 2 5 on the movable member 2 is in the middle _ Ε position ===== And contact the correction hole of the concave hole 2 3 axial movement

2將會記縣接_ F L 2 3下側壁而形成導通之迴路di? 向之位置顧並取二p:==GW軸 點B位置座;,如r在丨丨留;并社 ’又才乂正/ 口具之工作原 靖H 之座標位置。 作原可動件2 4取樣出校正治具2 2之工 原點位置棘,Ίj之位^賴彳林同於預設之工作 控制單元讀人由該形成導通作手段係於 ==實_後,與預設二 訊i=r2i之之偏= 2 4於校正後即可4依之據母執行轴程 修:補償,可動件 進行各項作業,·請參閱第9圖?動至工作原點位置β以 則係以探針2 5接觸至校正治且2 需進订Ζ軸向的校正時, 之迴路時,可由栌击丨罝_唁/〇八2 2之凹孔2 3底面而形成導通 了由控制早琳該形成導通迴路之工作原點 位置“ 可動件2 4之Z軸致動器自差*傳送命令訊號至 準取:it交工作2的方式’不僅可精 ^出目=產品及刊物公開,從而允符發明專以 【圖式簡單說明】 =1圖:本發明第一實施例之架構示意圖。 第3圖 第4圖 第5圖 第6圖 第7圖 第8圖 2圖本發明第一實施例取樣工作原點之示意圖。 ί關卫制關對_^狀示意圖。 本發明第二實施例之架構示意圖。 f發明第二實酬取樣Χ-γ派作原點之示 ^發明第二實施例取樣Χ-Υ派作原點之^ 本發明第二實施例取樣X-Y軸工作原點之示J 2 /.,U㈣.本發明第二實施例工作原點相對 ,:本發明第二實施例取樣2轴工作原=以圖。 【主要元件符號說明】 本發明部分: 10 13 16 2 0 23 26 12:校正治具 1 5 :探針 2 2 :校正治具 2 5 :探針 機台 11:固定件 導電針 14:可動件 發光燈號 機台 21:固定件 凹孔 2 4:可動件 發光燈號2 will count the county _ FL 2 3 lower side wall to form a conductive circuit di? To the position and take two p: == GW axis point B position seat;, such as r in the detention; The position of Yongzheng/mouth work is the coordinates of the original H. As the original movable member 2 4 samples the calibration fixture 2 2 work position position spine, Ίj position ^ Lai Yulin with the default work control unit read by the formation of the conduction means tied to == real _, and Preset two signals i=r2i bias = 2 4 After calibration, 4 can be used to perform shaft maintenance: compensation, movable parts for various operations, please refer to Figure 9 to move to the working origin position When β is contacted with the probe 25 to the correction and 2 is required to be corrected in the axial direction, the circuit can be turned on by the bottom surface of the recessed hole 2 3 of the 丨罝 唁 唁 〇 〇 2 2 2 2 2 By controlling the early Lin to form the working origin position of the conduction loop "Z-axis actuator of the movable member 2 4 self-difference * transmission command signal to the quasi-take: the way to pay the work 2" not only can be refined ^ product And publications are disclosed, so that the invention is specifically described in the following [FIG. 1] FIG. 3 is a schematic view showing the structure of the first embodiment of the present invention. FIG. 3, FIG. 4, FIG. 5, FIG. 6, FIG. A schematic diagram of the sampling work origin of the first embodiment of the present invention. ί Guan Wei is a schematic diagram of the second embodiment of the present invention. The second embodiment of the second embodiment of the present invention samples the XY axis working origin of the J 2 /., U (four). The working origin of the second embodiment of the present invention is opposite: the second embodiment of the present invention samples the 2-axis working original = Fig. [Description of main components] The present invention: 10 13 16 2 0 23 26 12: Correcting jig 1 5: Probe 2 2 : Correction fixture 2 5 : Probe machine table 11: Fixing member Conducting pin 14: Movable member Illuminating lamp No. 21: Fixing member recessed hole 2 4: Movable member light-emitting lamp No.

Claims (1)

十、申請專利範園: ι·=機台相對原點自動校正裝置,其 疋件.係設於機台之固定位置上;、、. 校正治具··係裝設於固定件上,苴為 位置裝設連接電路之導^針緣體,並於工作原點 °動件··係相對於固^件作多轴向移動,’ 之探針,並可使該探針移動接觸户正連接電路 ,使該電路形成導通之迴路;*〜之導電針 70 探針雜_校正治具之導電針時, 所測得各軸的實際位置,並置回授 置進行比對計算偏差量,原點位 行修正補償。 再命7母—軸致動器進 • 2請專利範圍第i項所述之機台相 導電針所在之工作原點位= 自動校正裝置, 發光燈號。 〜導電針與可動件探針之電路係裝設 二種機台相對原點自動校正方法, 取樣手段齡置義並接觸 ^ 具之導電針之工作原點位置,使電路形成 ^之迴路’控制單元並讀入該工作原點之座 位置; C正補&手& .於控鮮元讀人形成導通迴路之工作原點位 置回授所測得各軸的實際位置,並與預設之 工作原點位置進行比對計算兩者之偏差量, 控制單元再依據該偏差量傳送命令訊號至可 動件之每一軸致動器自動進行修正補償。 1334067 jff峨你Η爾 雜梅麵原點自動校 八中該取樣手段於電路形成導通之 又- 同時讀入該工作原點X一Υ_ζ各轴向 ^晋控制單元係可 •=機台相對原點自動校正裝置,其係= 固定件··係設於機台之固定位置上.’、 校正治具:==¾,連接有電路, 可動件·· 作多轴向移動裝設連接電路 ,治具之凹孔壁控制早70: m動t探針雜接觸校正治具之凹孔側壁時,ϊί導通迴路運算出之工作原點位 置口域秦各軸的實際位置,並與職之η置2行比對計算偏差量,再命令每-軸致 動态進仃修正補償。 •,申請專利範圍第6項所述 i:=r孔所在之工作:==定• 所述之機台相對原點自動校正裝置, 號。“接於校正治具與可動件探針之電路係裝設發光燈 .一種機台相對原點自動校正方法,其係包括·· 取樣手^糊可動件上之探針於第—軸向分別移動接觸 校正=具之凹孔兩側壁位置而形成導通之迴路, 控制單元並運算獲致兩位置之中間位置座標,可 動件上之探針再以該中間位置座標作第二軸向之 移動,並接觸校正治具之凹孔另兩側壁位置而形 成導通之迴路,控制單元於運算兩位置之中間位 置座k,即獲致校正治具工作原點之座標位置, 玉方法 6 7 8 9 12 日修正锌換頁丨 修正補償手原點之座標位置; 」 “控制早兀頃入杈正治具之工作原點位置回 授所測得各轴的實際位置,並與預設之工作 ,,進行比對計算兩者之偏差量,控制 早=再依據該偏差量傳送命令訊號至可動件 10 •,利範===二,X. Applying for the patent garden: ι·=The machine is automatically calibrated relative to the origin, and its components are set at the fixed position of the machine; and, the correction fixture is installed on the fixed part, 苴The position of the connecting circuit of the connecting circuit is installed for the position, and the moving part of the moving part is moved axially relative to the fixing member, and the probe can be moved to contact the household. Connect the circuit so that the circuit forms a conducting circuit; *~ the conductive pin 70 probe mis-corrects the conductive pin of the jig, the actual position of each axis is measured, and the deviation is calculated by performing the comparison. Point line correction compensation. Then the 7-mother-axis actuator is entered. 2 Please refer to the work origin position of the machine-phase conductive needle mentioned in item i of the patent range = automatic correction device, LED. ~ The circuit of the conductive pin and the movable probe is equipped with two kinds of machine automatic correction methods relative to the origin. The sampling means is set to the wrong position and contacts the working position of the conductive pin of the tool to make the circuit form a loop control. The unit is read into the seat position of the working origin; C positive complement & hand & . the actual position of each axis measured by the working origin position of the control loop forming the conduction loop, and preset The working origin position is compared with the calculation of the deviation between the two, and the control unit transmits the command signal to the actuator of each of the movable parts to automatically perform correction compensation according to the deviation amount. 1334067 jff峨 Η 杂 杂 面 面 原 自动 自动 自动 自动 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该Automatic point correction device, the system = fixed parts · is set at the fixed position of the machine. ', correction fixture: == 3⁄4, connected with circuit, movable parts · multi-axis moving installation connection circuit, When the concave wall of the jig is controlled 70:m, the t-probe miscellaneous contact is used to correct the concave side wall of the jig, and the actual position of the working axis position of each axis of the jig is calculated, and the η Set the 2 rows to calculate the deviation, and then command the per-axis to dynamically correct the compensation. •, the scope of application for patent scope item 6: i:= r hole where the work: == fixed • the machine relative to the origin automatic correction device, number. "The circuit of the calibration fixture and the movable probe is equipped with a light-emitting lamp. A method for automatically correcting the relative position of the machine includes: · The probe on the movable part of the sampler is in the first axial direction Moving contact correction=having a loop of the two side walls of the recessed hole to form a conductive circuit, and the control unit calculates the coordinates of the intermediate position of the two positions, and the probe on the movable member moves the second axial direction with the coordinate of the intermediate position, and Contacting the other two side wall positions of the concave hole of the correction jig to form a conduction circuit, and the control unit calculates the coordinate position of the working origin of the correction jig in the middle position of the two positions, and the jade method is corrected on the 6 7 8 12 12th. Zinc page change 丨 Correction compensates the coordinate position of the hand origin; ” “Controls the actual position of each axis measured by the work origin position of the 治 治 fixture, and compares the work with the preset work. The deviation between the two, control early = according to the deviation amount to transmit the command signal to the movable member 10 •, Li Fan === two, =元士人ΐ开面而形成導通之迴路’並可由控 三成導通迴路之工作原點位置回顺^= The Yuanshi people open the surface to form a conductive circuit' and can be controlled by the position of the working origin of the three-way conduction loop. 13 1334067 七、指定代表圖: (一) 本案指定代表圖為:第(2 )圖。 (二) 本代表圖之元件符號簡單說明: 10:機台 11:固定件 12:校正治具 13:導電針 14:可動件 15:探針 16:發光燈號13 1334067 VII. Designated representative map: (1) The representative representative of the case is: (2). (2) Simple description of the symbol of the representative figure: 10: Machine table 11: Fixing piece 12: Correcting jig 13: Conductive pin 14: Movable piece 15: Probe 16: Illuminated light 八、本案若有化學式時,請揭示最能顯示發明特徵的化學式:8. If there is a chemical formula in this case, please disclose the chemical formula that best shows the characteristics of the invention:
TW96108828A 2007-03-14 2007-03-14 Device and method for electronically automatic alignment relative to origin TWI334067B (en)

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TWI491884B (en) * 2012-06-13 2015-07-11 台灣積體電路製造股份有限公司 Method of positioning probes and wafers

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TWI416141B (en) * 2009-06-01 2013-11-21 Hon Hai Prec Ind Co Ltd System and method for testing a printed circuit board
JP4829359B2 (en) * 2010-03-31 2011-12-07 ファナック株式会社 Calculation method of probe mounting position of on-machine measuring device
TWI675432B (en) * 2018-10-01 2019-10-21 科儀電子股份有限公司 Test position registration correction device
CN112731006B (en) * 2020-12-09 2025-01-28 中国船舶重工集团公司第七0九研究所 Origin positioning compensation device and method in electrical automatic measurement system
CN113110297B (en) * 2021-03-31 2022-05-10 成都飞机工业(集团)有限责任公司 Method for preventing origin from being used wrongly in numerical control machining process

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI491884B (en) * 2012-06-13 2015-07-11 台灣積體電路製造股份有限公司 Method of positioning probes and wafers

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