TW201947185A - Linear displacement sensing device capable of accurately obtaining a position of a magnetic test object in a measurement section - Google Patents

Linear displacement sensing device capable of accurately obtaining a position of a magnetic test object in a measurement section Download PDF

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TW201947185A
TW201947185A TW107114966A TW107114966A TW201947185A TW 201947185 A TW201947185 A TW 201947185A TW 107114966 A TW107114966 A TW 107114966A TW 107114966 A TW107114966 A TW 107114966A TW 201947185 A TW201947185 A TW 201947185A
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magnetic field
magnetic
permanent magnet
extreme
sensing
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TW107114966A
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TWI657228B (en
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鄧立國
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馳達科技股份有限公司
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Abstract

The present invention discloses a linear displacement sensing device including a first sensing set and a second sensing set, which are arranged in parallel at two ends of the same side of a measurement section in a displacement path of a magnetic test object. The first sensing set includes a first permanent magnet and a first magnetic sensing unit. The second sensing set includes a second permanent magnet and a second magnetic sensing unit. With the composition of the aforementioned components, the first and second permanent magnets respectively have a first variable magnetic field and a second variable magnetic field which partially overlap at the measurement section. The first and second variable magnetic fields will be changed by the displacement of the magnetic test object. The first and second magnetic sensing units sense the aforementioned changes and output first and second variable magneto-electric signals. Through the cross-comparison of the first and second variable magneto-electric signals, the position of the magnetic test object in the measurement section can be accurately obtained.

Description

線性位移感測裝置    Linear displacement sensing device   

本發明係有關於一種量測設備相關之技術領域,尤其是指一種線性位移感測裝置。 The present invention relates to the technical field related to a measuring device, and particularly to a linear displacement sensing device.

於工業自動化中,位置量測乃是一重要任務。諸如電腦化數值控制工具機(computed numerically controlled(CNC)machines)、鑽頭(drill bits)、機器人手臂(robot arm)、雷射切割器(laser cutter)之裝置等等,都需要精確的位置量測以用於反饋控制(feedback control)。期望以高取樣率(sampling rate)進行位置量測以致於能進行反饋控制。 Position measurement is an important task in industrial automation. Devices such as computed numerically controlled (CNC) machines, drill bits, robot arms, laser cutters, etc. all require precise position measurement For feedback control. It is desirable to perform position measurement at a high sampling rate so that feedback control can be performed.

舉例言之,常見光學編碼器(optical encoder)係用以量測絕對或相對位置。典型而言,具有規律性間隔標記之標尺(scale)與感測器一起使用,用以量測介於兩個標的間之相對位置。常見之光學編碼器依功能大致可區分: 增量式線性編碼器(Incremental linear encoder)僅能量測位於該標尺上標記內之相對位置。 For example, common optical encoders are used to measure absolute or relative positions. Typically, a scale with regularly spaced marks is used with a sensor to measure the relative position between two scales. Common optical encoders can be roughly distinguished according to their functions: Incremental linear encoders only measure the relative position of the energy within the marks on the scale.

相對位置編碼器(relative position encoder)係持續追蹤橫越過標記之數量以判定相對位置。 The relative position encoder continuously tracks the number of traversed marks to determine the relative position.

絕對位置編碼器能判定絕對位置,且絕對位置編碼器(absolute position encoder)不需要記憶體及電源以儲存最後的位置,因此適用於某些應用中。此外,絕對位置編碼器係能 於啟動時提供一絕對位置,而相對位置編碼器典型而言需要去定位起始位置(start point),於某些應用時可能並不實用。 The absolute position encoder can determine the absolute position, and the absolute position encoder does not require memory and power to store the last position, so it is suitable for some applications. In addition, the absolute position encoder can provide an absolute position at startup, while the relative position encoder typically needs to locate the start point, which may not be practical in some applications.

習知絕對位置編碼器,需使用獨特的編碼樣式以量測每一個位置。儘管此種編碼器係使用標尺,惟只有在樣式改變時,才會判定有位置改變。於此情形中,位置估計(position estimate)之解析度受限於該樣式之解析度。 Knowing the absolute position encoder requires using a unique encoding style to measure each position. Although this encoder uses a ruler, only when the style is changed, it is determined that there is a position change. In this case, the resolution of the position estimate is limited by the resolution of the pattern.

同樣的,習知相對線性編碼器,利用光學偵測標尺上之標記以量測線性位置,該標記係平行於讀取頭(readhead)固設於一預設位置。然而,所得到之位置解析度亦被標尺上之標記解析度所限定。舉例言之,於該標尺上之標記係可能以40微米(micron)之解析度列印,故其精度被限制在40微米(micron)以下,而無法高於40微米。 Similarly, the conventional relatively linear encoder uses a mark on an optical detection ruler to measure a linear position, and the mark is fixed at a preset position parallel to the readhead. However, the obtained position resolution is also limited by the mark resolution on the scale. For example, the marks on the scale may be printed at a resolution of 40 micrometers (micron), so the accuracy is limited to 40 micrometers or less, and cannot be higher than 40 micrometers.

為了增進解析度,曾有業者提出教案,使用兩個標尺,各標尺於檢測方向上對齊且具有週期之標尺樣式,例如白色及黑色之標記。該標尺係由一側被照亮,且一光二極體係感測到穿透該兩個標尺至另一側之光線,隨著該標尺相對彼此移動,該光二極體之信號係介於一最大及一最小之強度值(intensity value)間變化。使用一解調程序(demodulation process)以判定該信號之相(phase),其係被轉變為相對位置,該相對位置係能以高於標尺解析度的解析度被還原。 In order to improve the resolution, there have been proposals from industry players to use two scales, each of which is aligned in the detection direction and has a periodic scale style, such as white and black marks. The ruler is illuminated from one side, and a photodiode system senses the light that penetrates the two rulers to the other side. As the rulers move relative to each other, the signal of the photodiode is between a maximum And a minimum intensity value. A demodulation process is used to determine the phase of the signal, which is transformed into a relative position that can be restored at a resolution higher than the resolution of the scale.

然而,此種設計僅提供相對位置。為了擁有判定絕對位置之能力,某些複合式編碼器係使用額外的標尺,如此反增加了系統之成本與複雜性。此種複合式編碼器係使用個別之標尺來量測增量位置與絕對位置,但該複合式編碼器需要使用兩個讀取頭,第一讀取頭用以讀取該增量位置,且第二讀取頭用以讀取該絕對位置。 However, this design only provides relative positions. In order to have the ability to determine the absolute position, some composite encoders use additional scales, which in turn increases the cost and complexity of the system. This composite encoder uses separate scales to measure the incremental position and absolute position, but the composite encoder requires two read heads, the first read head is used to read the incremental position, and The second reading head is used to read the absolute position.

由上述習知編碼器之結構與限制可知,都需配合一標尺,緃是使磁性碼碼器亦需配合一磁尺使用,且都無法解決使用單一編碼器取得之單一感測訊號,同時輸出相對位置與絕對位置等多種資訊之需求。除此之外,上述光學式或磁性編碼器,都十分容易受環境之清潔、溫度等等影響,導致精準度的喪失。 It can be known from the structure and limitations of the above-mentioned conventional encoders that they all need to be equipped with a scale. That is, the magnetic encoder must also be used with a magnetic scale, and they cannot solve the single sensing signal obtained by a single encoder and output at the same time Relative and absolute information needs. In addition, the above-mentioned optical or magnetic encoders are very susceptible to environmental cleanliness, temperature, etc., resulting in loss of accuracy.

另外,習知利用磁場變化作為位移感測之方法,常見使用霍爾元件來達成,例如中國CN100376872C號(以下簡稱文獻1)。文獻1之結構特徵必需在被測量物上設置一個磁性元件,透過磁性元件所產生之磁場觸發霍爾元件響應,其缺失包括: In addition, it is known to use a magnetic field change as a method of displacement sensing, which is commonly achieved using a Hall element, such as China CN100376872C (hereinafter referred to as Document 1). The structural feature of Document 1 requires a magnetic element on the object to be measured, and the Hall element response is triggered by the magnetic field generated by the magnetic element. The defects include:

1.被測物能否准許額外安裝磁性元件,如果不行則文獻1則無法實施。 1. Whether the test object can be allowed to install additional magnetic components, if not, reference 1 cannot be implemented.

2.被測物上之磁性元件,其磁場容易被機構本身之導磁結構所牽引,而無法達到足以觸發霍爾元件之磁量,致使設置過程中,必需額外的對被測物局部結構進行設計與改良,以確保磁性元件之磁量。 2. The magnetic field of the magnetic component on the test object is easy to be pulled by the magnetically permeable structure of the mechanism itself, and cannot reach the magnetic quantity sufficient to trigger the Hall element. As a result, the local structure of the test object must be additionally performed during the setting process. Design and improvement to ensure the magnetic quantity of magnetic components.

3.被測物設置磁性元件,運用於金屬加工時,容易磁吸鐵屑。 3. The test object is provided with magnetic components, which is easy to magnetically attract iron filings when applied to metal processing.

4.霍爾元件容易受環境干擾而失真,例如要對非線性的溫度漂移進行補償。 4. Hall elements are easily distorted by environmental interference, such as to compensate for non-linear temperature drift.

5.霍爾元件帶寬有限;對小量程的電流進行測量時,要求使用大偏置電壓,這會引起誤差;易受外部磁場的影響。 5. The Hall element has a limited bandwidth; when measuring a small range of current, a large bias voltage is required, which will cause errors; it is susceptible to external magnetic fields.

有鑑於上述習知技藝之問題與缺失,本發明之主 要目的,乃在於提供一種線性位移感測裝置,藉由結構的設計,提供對導磁被測物微量運動感測之需求。 In view of the problems and deficiencies of the above-mentioned conventional techniques, the main purpose of the present invention is to provide a linear displacement sensing device, which, by the design of the structure, provides the demand for the micro motion sensing of the magnetically permeable object.

本發明之另一目的,在於提供一種線性位移感測裝置,藉由結構的設計,克服習知光學編碼器或磁性編碼器結構上之缺失與量測資訊提供上之限制。 Another object of the present invention is to provide a linear displacement sensing device, which overcomes the defects in the structure of conventional optical encoders or magnetic encoders and the limitation in the provision of measurement information through the design of the structure.

根據本發明上述目的,提出一種線性位移感測裝置,包含一第一、二感測組,係平行分設置於一導磁被測物位移路徑中,量測區段同側之兩端。該第一感測組,包含一第一永磁件與一第一磁感測單元。而該第二感測組,包含一第二永磁件與一第二磁感測單元。藉由上述構件之組成,第一、二永磁件分別於量測區段,並具有局部重疊之一第一、二變動磁場,且第一、二變動磁場會受導磁被測物之位移而改變,又第一、二磁感測單元感測其變化並輸出一第一、二變動磁電訊號,透過第一、二變動磁電訊號之交差比對,精確的取得導磁被測物於量測區段中之位置。 According to the above object of the present invention, a linear displacement sensing device is provided. The linear displacement sensing device includes a first sensing group and a second sensing group, which are arranged in parallel in a displacement path of a magnetically permeable measuring object, and the two ends of the measurement section on the same side. The first sensing group includes a first permanent magnet and a first magnetic sensing unit. The second sensing group includes a second permanent magnet and a second magnetic sensing unit. With the composition of the above components, the first and second permanent magnets are respectively located in the measurement section, and have one of the first and second changing magnetic fields that partially overlap, and the first and second changing magnetic fields are subject to the displacement of the magnetically measured object When it changes, the first and second magnetic sensing units sense the change and output a first and second variable magnetic-electrical signal. Through the cross-comparison of the first and second variable magnetic-electrical signals, the magnetically permeable object is accurately measured. Test the position in the segment.

100‧‧‧線性位移感測裝置 100‧‧‧ linear displacement sensing device

10‧‧‧第一感測組 10‧‧‧The first sensing group

12‧‧‧第一永磁件 12‧‧‧The first permanent magnet

122‧‧‧第一變動磁場 122‧‧‧The first changing magnetic field

124‧‧‧第一基準磁場 124‧‧‧first reference magnetic field

20‧‧‧第二感測組 20‧‧‧Second sensing group

22‧‧‧第二永磁件 22‧‧‧Second permanent magnet

222‧‧‧第二變動磁場 222‧‧‧Second Variable Magnetic Field

224‧‧‧第二基準磁場 224‧‧‧second reference magnetic field

M‧‧‧導磁被測物 M‧‧‧ Magnetically Measured Object

P‧‧‧位移路徑 P‧‧‧Displacement path

PS‧‧‧量測區段 PS‧‧‧Measurement Section

V1‧‧‧第一磁感測單元 V1‧‧‧The first magnetic sensing unit

V2‧‧‧第二磁感測單元 V2‧‧‧Second magnetic sensing unit

CS1‧‧‧第一變動磁電訊號 CS1‧‧‧First change magnetic signal

CS2‧‧‧第二變動磁電訊號 CS2‧‧‧Second Change Magnetic Signal

0‧‧‧原點 0‧‧‧ origin

第1圖 係本發明實施例示意圖。 FIG. 1 is a schematic diagram of an embodiment of the present invention.

第2圖 係本發明第一、二變動磁電訊號示意圖。 Figure 2 is a schematic diagram of the first and second variable magnetic-electric signals of the present invention.

以下請參照相關圖式進一步說明本發明線性位移感測裝置實施例,為便於理解本發明實施方式,以下相同元件係採相同符號標示說明。 The following further describes the embodiments of the linear displacement sensing device of the present invention with reference to related drawings. In order to facilitate understanding of the embodiments of the present invention, the same components are denoted by the same symbols in the following description.

請參閱第1至2圖所示,本發明線性位移感測裝 置100,係包含一第一、二感測組10、20,採平行配置於導磁被測物M之位移路徑P中所欲量測區段PS同側兩端,用以同時對導磁被測物M進行位移量測。 Please refer to FIG. 1 and FIG. 2. The linear displacement sensing device 100 of the present invention includes a first and a second sensing group 10 and 20, which are arranged in parallel in a displacement path P of a magnetically permeable measurement object M. Both ends of the measurement section PS on the same side are used to measure the displacement of the magnetically-measured object M at the same time.

上述第一感測組10,包含一第一永磁件12與一第一磁感測單元V1,而上述第二感測組20亦包含一第二永磁件22與一第二磁感測單元V2。 The first sensing group 10 includes a first permanent magnet 12 and a first magnetic sensing unit V1, and the second sensing group 20 also includes a second permanent magnet 22 and a second magnetic sensing Unit V2.

所述第一永磁件12,其N極端與S極端同心直交於導磁被測物M之位移路徑P,且以第一永磁件12之N極端毗鄰導磁被測物M之位移路徑P。該第一永磁件12沿S極端朝N極端運動之第一磁力線分別於第一永磁件12外周側相反位置形成一第一變動磁場122及一第一基準磁場124;其中,第一變動磁場12與導磁被測物M位移路徑P中之量測區段PS局部重疊。實施時,第一變動磁場12與量測區段PS重疊部份以不低於量測區段PS總長度50%為佳。 In the first permanent magnet 12, the N extreme and the S extreme concentrically intersect with the displacement path P of the magnetically permeable measurement object M, and the N permanent pole of the first permanent magnet 12 is adjacent to the displacement path of the magnetically permeable measurement object M. P. The first magnetic field lines of the first permanent magnet 12 moving along the S extreme to the N extreme form a first variable magnetic field 122 and a first reference magnetic field 124 at opposite positions on the outer peripheral side of the first permanent magnet 12 respectively. The magnetic field 12 partially overlaps the measurement section PS in the displacement path P of the magnetically permeable measurement object M. During implementation, it is preferable that the overlapping portion of the first variable magnetic field 12 and the measurement section PS is not less than 50% of the total length of the measurement section PS.

且第一變動磁場122會因導磁被測物M相距第一永磁件12之遠近,而對第一變動磁場122形成磁牽引,進而改變第一變動磁場122之磁力變化。 In addition, the first variable magnetic field 122 will form a magnetic traction on the first variable magnetic field 122 due to the distance between the magnetically permeable object M and the first permanent magnet 12, thereby changing the magnetic force change of the first variable magnetic field 122.

另外,第一基準磁場124相對於第一變動磁場122,則是常態處於一穩定之狀態,不易受導磁被測物M之干擾而隨意變動,亦可透過磁收斂之結構設計使第一基準磁場124收斂,以縮小第一基準磁場124之範圍(增強第一基準磁場124強度),避免受導磁被測物M之牽引而改變,確保第一基準磁場124之穩定。(第一基準磁場124及其運用非本案之重點,故不多作贅述) In addition, the first reference magnetic field 124 is normally in a stable state relative to the first fluctuating magnetic field 122, and is not easily changed by the magnetically-measuring object M, and the first reference can also be made by the structure design of the magnetic convergence The magnetic field 124 converges to reduce the range of the first reference magnetic field 124 (intensify the strength of the first reference magnetic field 124), avoid being changed by being pulled by the magnetically guided measurement object M, and ensure the stability of the first reference magnetic field 124. (The first reference magnetic field 124 and its application are not the focus of this case, so I will not repeat them here)

所述第二永磁件22,其N極端與S極端同心直交於導磁被測物M之位移路徑P,且以第二永磁件22之N極端 毗鄰導磁被測物M位移路徑P。該第二永磁件22沿S極端朝N極端運動之第二磁力線,分別於第二永磁件22外周側相反位置形成一第二變動磁場222及一第二基準磁場224;其中,第二變動磁場222與導磁被測物M位移路徑P中之量測區段PS局部重疊。實施時,第二變動磁場222與量測區段PS重疊部份以不低於量測區段PS總長度50%為佳。 In the second permanent magnet 22, the N extreme and the S extreme concentrically intersect with the displacement path P of the magnetically permeable test object M, and the second permanent magnet 22 is adjacent to the displacement path P of the magnetically permeable measurement object M . The second magnetic field line of the second permanent magnet member 22 moving along the S extreme end toward the N extreme end forms a second variable magnetic field 222 and a second reference magnetic field 224 at opposite positions on the outer peripheral side of the second permanent magnet part 22, respectively. The fluctuating magnetic field 222 partially overlaps the measurement section PS in the displacement path P of the magnetically permeable measurement object M. During implementation, the overlapping part of the second variable magnetic field 222 and the measurement section PS is preferably not less than 50% of the total length of the measurement section PS.

且第二變動磁場222會因導磁被測物M相距第二永磁件22之遠近,而對第二變動磁場222形成磁牽引,進而改變第二變動磁場222之磁力變化。 In addition, the second variable magnetic field 222 will form a magnetic traction on the second variable magnetic field 222 due to the distance between the magnetically permeable measurement object M and the second permanent magnet 22, thereby changing the magnetic force change of the second variable magnetic field 222.

另外,第二基準磁場224相對於第二變動磁場222則是,常態處於一穩定之狀態不易受導磁被測物M之干擾而隨意變動,亦可透過磁收斂之結構設計使第二基準磁場224收斂以縮小第二基準磁場224之範圍(增強第二基準磁場224強度),避免受導磁被測物M之牽引而改變,確保第二基準磁場224之穩定。(第二基準磁場224及其運用非本案之重點,故不多作贅述) In addition, compared with the second variable magnetic field 222, the second reference magnetic field 224 is in a stable state and is not easily changed by the magnetically-measuring object M, and the second reference magnetic field can also be made by the structural design of magnetic convergence 224 converges to reduce the range of the second reference magnetic field 224 (intensify the intensity of the second reference magnetic field 224), to avoid being changed by being pulled by the magnetically permeable measurement object M, and to ensure the stability of the second reference magnetic field 224. (The second reference magnetic field 224 and its application are not the focus of this case, so I will not repeat them here.)

上述第一、二磁感測單元V1、V2,係為相同之構件,其包含有至少一磁阻元件所組成之磁感電路。實施時,本案排除使用霍爾元件。 The first and second magnetic sensing units V1 and V2 are the same components and include a magnetic induction circuit composed of at least one magnetoresistive element. When implemented, this case excludes the use of Hall elements.

所述第一磁感測單元V1,係配置於導磁被測物M之位移路徑P與第一永磁件12之N極端之間,俾以對第一永磁件12之第一變動磁場122(或及第一基準磁場124)之磁變化進行感測組,並依感測輸出一第一變動磁電訊號CS1(或及第一基準磁電訊號、圖中未示)。 The first magnetic sensing unit V1 is disposed between the displacement path P of the magnetically permeable measuring object M and the N extreme end of the first permanent magnet piece 12 so as to apply a first variable magnetic field to the first permanent magnet piece 12. The magnetic change of 122 (or the first reference magnetic field 124) is used for the sensing group, and a first variable magnetic signal CS1 (or the first reference magnetic signal, not shown in the figure) is output according to the sensing.

所述第二磁感測單元V2,係配置於導磁被測物M之位移路徑P與第二永磁件22之N極端之間,俾以對第二永 磁件22之第二變動磁場222(或及第二基準磁場224)之磁變化進行感測組,並依感測輸出一第二變動磁電訊號CS2(或及第二基準磁電訊號、圖中未示)。 The second magnetic sensing unit V2 is disposed between the displacement path P of the magnetically permeable measurement object M and the N extreme end of the second permanent magnet member 22, so as to meet the second changing magnetic field of the second permanent magnet member 22. The magnetic change of 222 (or the second reference magnetic field 224) is used for the sensing group, and a second variable magnetic signal CS2 (or the second reference magnetic signal, not shown in the figure) is output according to the sensing.

是以,上述即為本發明所提供一較佳實施例線性位移感測裝置各部構件及組裝方式之介紹,茲再將本發明之實施例作動特點介紹如下。 Therefore, the above is an introduction to the components and assembly methods of a linear displacement sensing device according to a preferred embodiment of the present invention, and the operating characteristics of the embodiments of the present invention are described below.

首先,請參閱第1、2圖所示,導磁被測物M位移於量測區段PS各點之位置變位化,都會對第一、二永磁件12、24所形成之第一、二變動磁場122、222形成不同程度之磁牽引,而第一、二變動磁場122、222之變化都會分別被第一、二磁感測單元V1、V2各自感知,透過第一、二磁感測單元V1、V2將第一、二變動磁場122、222之變化,分別轉換成電訊號以輸出第一、二變動磁電訊號CS1、CS2。 First, please refer to Figs. 1 and 2. As shown in Figs. 1 and 2, the position of the magnetically susceptible object M being displaced at each point of the measurement section PS will change the first formed by the first and second permanent magnets 12, 24. The second and second variable magnetic fields 122 and 222 form different degrees of magnetic traction, and the changes in the first and second variable magnetic fields 122 and 222 will be sensed by the first and second magnetic sensing units V1 and V2, respectively. The measuring units V1 and V2 convert the changes of the first and second variable magnetic fields 122 and 222 into electrical signals respectively to output the first and second variable magnetic and electrical signals CS1 and CS2.

請參閱第2圖所示,我們透過以下曲線圖來說明導磁被測物M位移於量測區段PS各點位置,對第一、二變動磁場122、222之磁牽引作用,導致第一、二變動磁電訊號CS1、CS2之變化關係。 Please refer to Figure 2. We use the following graph to explain the displacement of the magnetically susceptible measurement object M at each point of the measurement section PS, which has a magnetic traction effect on the first and second variable magnetic fields 122 and 222, resulting in the first Second, the change of the relationship between the change of the magnetic and electrical signals CS1 and CS2.

第2圖中之X軸我們將其視為數軸座標(亦可視為為量測區段PS),其具有一原點0,而坐標值中之正值或負值則依導磁被測物M在原點的哪一側來決定。透過這樣的界定我們可以將經過原點0朝第一永磁件12方向運動之座標以正值來表示(數字越大表示越近)。反之,經過原點0朝第二永磁件22方向運動之座標以負值(數字越大表示越近)來表示。另外,第2圖中之Y軸係表示第一、二變動磁電訊號CS1、CS2之強弱(數字越大表示越強)。 The X axis in Fig. 2 is regarded as the coordinate of several axes (also can be regarded as the measurement section PS), which has an origin of 0, and the positive or negative value in the coordinate value depends on the magnetically measured object. Decide on which side of M the origin is. Through such a definition, we can express the coordinates of the movement through the origin 0 in the direction of the first permanent magnet 12 as a positive value (the larger the number, the closer it is). On the contrary, the coordinates of the movement toward the second permanent magnet 22 after passing through the origin 0 are represented by a negative value (the larger the number, the closer it is). In addition, the Y-axis system in the second figure indicates the strength of the first and second variable magneto-electric signals CS1 and CS2 (the larger the number, the stronger it is).

而有關原點0之定義,係指當導磁被測物M位移 於量測區段PS之中間段時,導磁被測物M對第一、二變動磁場122、222之磁牽引力相同(如圖中Y軸5位置),故第一、二磁感測單元V1、V2輸出之第一、二變動磁電訊號CS1、CS2趨近於相同,於此一位置將其視為原點0。 The definition of the origin 0 means that when the magnetically susceptible object M is displaced in the middle of the measurement section PS, the magnetic traction force of the magnetically susceptible object M to the first and second variable magnetic fields 122 and 222 is the same ( As shown in the figure, the Y axis is at position 5), so the first and second variable magnetic and electrical signals CS1 and CS2 output by the first and second magnetic sensing units V1 and V2 are approaching the same.

若導磁被測物M朝第一永磁件12之第一變動磁場122趨近時,第一變動磁電訊號CS1則會呈一逐漸增加之曲線,而對第二變動磁場222之磁牽引逐漸弱化,因此第二變動磁電訊號CS2則會呈一逐漸弱化之曲線化。相反的,若導磁被測物M朝第二永磁件22運動時,相關之第一、二變動磁電訊號CS1、SC2呈現,則與上述結果相反。 If the magnetically-measuring object M approaches the first variable magnetic field 122 of the first permanent magnet 12, the first variable magnetic-electrical signal CS1 will have a gradually increasing curve, and the magnetic traction of the second variable magnetic field 222 gradually Weakening, so the second change magnetic signal CS2 will show a gradually weakening curve. On the contrary, if the magnetically permeable test object M moves toward the second permanent magnet 22, the related first and second variable magnetic and electrical signals CS1 and SC2 appear, which is opposite to the above result.

利用導磁被測物M位於量測區段PS中各點位置之第一、二變動磁電訊號CS1、CS2組合(連續曲線),依需求於後端進行定義(編碼),即可明確取得導磁被測物M於量測區段PS中之絕對位置,或導磁被測物M相對第一、二磁感測單元V1、V2之相對位置。也由於可以將各點或位移量作編碼,後端可取各點作為控制之回饋,而不再只是單純的開關之用。 Using the combination of the first and second variable magnetic and electrical signals CS1 and CS2 (continuous curves) of the magnetically susceptible object M located at each point in the measurement section PS, it can be defined (encoded) at the back end as required, and the guide can be clearly obtained The absolute position of the magnetic measurement object M in the measurement section PS, or the relative position of the magnetic measurement object M with respect to the first and second magnetic sensing units V1 and V2. Also, because each point or displacement can be coded, the back end can take each point as feedback for control, instead of just being used for switching.

再者,更進一步的利用第一、二變動磁電訊號CS1、CS2之交差比對,則更加精確的取得導磁被測物M之位移量及位置。 Furthermore, the cross-comparison of the first and second variable magneto-electric signals CS1 and CS2 is further used to more accurately obtain the displacement and position of the magnetically permeable measurement object M.

本發明實施例中,導磁被測物M於位於量測區段PS中各點位置都可被定義(編碼),故緃使電力中斷後再次回覆時,導磁被測物M無需返回原點0,後端裝置仍可透過第一、二變動磁電訊號CS1、CS2判定該導磁被測物M於量測區段PS中任一位置。 In the embodiment of the present invention, the magnetically permeable test object M can be defined (encoded) at each position in the measurement section PS. Therefore, when the power is interrupted and re-replyed, the magnetically permeable test object M need not return to the original At 0, the back-end device can still determine whether the magnetically permeable object M is in any position in the measurement section PS through the first and second variable magneto-electric signals CS1 and CS2.

以上所述說明,僅為本發明的較佳實施方式而已,意在明確本發明的特徵,並非用以限定本發明實施例的範 圍,本技術領域內的一般技術人員根據本發明所作的均等變化,以及本領域內技術人員熟知的改變,仍應屬本發明涵蓋的範圍。 The above description is only a preferred embodiment of the present invention, and is intended to clarify the features of the present invention, and is not intended to limit the scope of the embodiments of the present invention. Equal changes made by those skilled in the art based on the present invention , And changes well known to those skilled in the art, should still fall within the scope of the present invention.

Claims (4)

一種線性位移感測裝置,係包含平行分設置於一位移路徑中之一量測區段同一側兩端之一第一、二感測組,用以對一導磁被測物進行位移量測,其中:該第一感測組,包含一第一永磁件與一第一磁感測單元;該第一永磁件,其N極端與S極端同心直交於該位移路徑,且以該第一永磁件之N極端毗鄰該位移路徑,又該第一永磁件,沿S極端朝N極端運動之第一磁力線於該第一永磁件外周側形成一第一變動磁場,使該第一變動磁場與該量測區段局部重疊,而該第一變動磁場會被該導磁被測物M相距之遠近形成磁力牽引;該第一磁感測單元,係包含有至少一磁阻元件所組成之磁感電路,配置於該位移路徑與該第一永磁件N極端之間,俾以對該第一變動磁場之磁變化進行感測,並依感測輸出一第一變動磁電訊號;該第二感測組,包含一第二永磁件與一第二磁感測單元;該第二永磁件,其N極端與S極端同心直交於該位移路徑,且以該第二永磁件之N極端毗鄰該位移路徑,又該第二永磁件,沿S極端朝N極端運動之第二磁力線於該第二永磁件外周側形成一第二變動磁場,使該第二變動磁場與該量測區段及該第二變動磁場局部重疊,而該第二變動磁場會被該導磁被測物相距之遠近形成磁力牽引;該第二磁感測單元,係包含有至少一磁阻元件所組 成之磁感電路,配置於該位移路徑與該第二永磁件N極端之間,俾以對該第二變動磁場之磁變化進行感測,並依感測輸出一第二變動磁電訊號;其中,透過該第一、二變動磁電訊號之變化,提供後端作為對該導磁被測物於該量測區段中微量位移之反饋。     A linear displacement sensing device includes a first and a second sensing group arranged in parallel on one end of a measurement section in a displacement path, and is used for displacement measurement of a magnetically permeable object. Wherein, the first sensing group includes a first permanent magnet and a first magnetic sensing unit; the first permanent magnet whose N extreme and S extremes are concentric to the displacement path, and the first permanent The N extreme of a permanent magnet piece is adjacent to the displacement path, and the first permanent magnetic piece forms a first magnetic field on the outer peripheral side of the first permanent magnet piece with the first magnetic field line moving along the S extreme toward the N extreme, so that the A fluctuating magnetic field partially overlaps the measurement section, and the first fluctuating magnetic field will be magnetically pulled by the distance between the magnetically permeable measurement object M; the first magnetic sensing unit includes at least one magnetoresistive element The formed magnetic induction circuit is disposed between the displacement path and the first permanent magnet N extreme pole, so as to sense the magnetic change of the first changing magnetic field, and output a first changing magnetic-electrical signal according to the sensing. ; The second sensing group includes a second permanent magnet and a second magnetic sensing unit ; The second permanent magnet, whose N extreme and S extreme are concentric and orthogonal to the displacement path, and the N extreme of the second permanent magnet is adjacent to the displacement path, and the second permanent magnet is along the S extreme toward N The second magnetic field line of extreme motion forms a second fluctuating magnetic field on the outer peripheral side of the second permanent magnet, so that the second fluctuating magnetic field partially overlaps the measurement section and the second fluctuating magnetic field, and the second fluctuating magnetic field will The magnetic traction is formed by the distance between the magnetically permeable measurement object; the second magnetic sensing unit includes a magnetic induction circuit composed of at least one magnetoresistive element, and is arranged on the displacement path and the second permanent magnet N Between extremes, the magnetic change of the second variable magnetic field is sensed, and a second variable magneto-electric signal is output according to the sensing. Among them, the back end is provided as a countermeasure through the changes of the first and second variable magnetic-electric signals. Feedback of the micro-displacement of the magnetically measured object in the measurement section.     如申請專利範圍第1項所述之線性位移感測裝置,其中該第一、二變動磁場與該量測區段重疊部份為該量測區段總長度60%至100%。     According to the linear displacement sensing device described in the first item of the patent application scope, wherein the overlapping portion of the first and second variable magnetic fields and the measurement section is 60% to 100% of the total length of the measurement section.     如申請專利範圍第1項所述之線性位移感測裝置,其中該第一永磁件沿S極端朝N極端運動之第一磁力線,更於該第一永磁件外周側形成一第一基準磁場,且該第一基準磁場形成之位置相反於該第一變動磁場。     The linear displacement sensing device according to item 1 of the scope of patent application, wherein the first magnetic field line of the first permanent magnet moving along the S extreme to the N extreme forms a first datum on the outer peripheral side of the first permanent A magnetic field, and a position where the first reference magnetic field is formed is opposite to the first fluctuating magnetic field.     如申請專利範圍第1項所述之線性位移感測裝置,其中該第二永磁件沿S極端朝N極端運動之第二磁力線,更於該第二永磁件外周側形成一第二基準磁場,且該第一基準磁場形成之位置相反於該第二變動磁場。     The linear displacement sensing device according to item 1 of the scope of the patent application, wherein the second magnetic field line of the second permanent magnet moving along the S extreme to the N extreme forms a second reference on the outer peripheral side of the second permanent A magnetic field, and a position where the first reference magnetic field is formed is opposite to the second fluctuating magnetic field.    
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