CN113063977B - Simulation test method, simulation test device and computer-readable storage medium - Google Patents

Abstract

Embodiments of the present disclosure provide an analog testing method, apparatus, and computer-readable storage medium, the method comprising: receiving a front eye diagram, obtaining eye height data and eye width data of the front eye diagram, and performing eye balance (EQ) processing on the eye height data and the eye width data of the front eye diagram to obtain simulated back eye diagram eye height data and eye width data; acquiring a test temperature value, and calculating to obtain a temperature compensation value according to the test temperature value and a temperature compensation function obtained in advance; and compensating the simulated back eye image high data and the simulated eye width data by using the temperature compensation value to obtain the compensated simulated eye image high data and the simulated eye width data. By performing temperature compensation on the simulated back eye height and eye width data, the attenuation of eye transmission signals caused by the ambient temperature can be avoided, and the test result is more accurate.

Description

Simulation test method, device and computer-readable storage medium

Technical field

The embodiments of the present disclosure relate to the field of display technology, and specifically relate to a simulation testing method, device and computer-readable storage medium.

Background technique

The eye diagram is a graph in which a series of digital signals are accumulated and displayed on an oscilloscope. It contains a wealth of information. The effects of inter-symbol crosstalk and noise can be observed from the eye diagram, which reflects the overall characteristics of the digital signal, thereby estimating the system optimization. Therefore, eye diagram analysis is the core of signal integrity analysis of high-speed interconnection systems.

When testing the source driver (Source IC, S-IC), the eye diagram before the SOC (Sstem On a Chip, system on a chip) is transmitted to the S-IC (Source IC, source driver) is the front eye diagram. After S- The eye diagram after IC processing is the rear eye diagram. During actual testing, the eye diagram equalizer (EQ, Equalizer) algorithm can be used to simulate the data received by the S-IC to achieve product test evaluation.

Contents of the invention

Embodiments of the present disclosure provide a simulation testing method, device and computer-readable storage medium, which can obtain more accurate test results.

On the one hand, embodiments of the present disclosure provide a simulation testing method, including:

Receive the front eye diagram, obtain the eye height data and eye width data of the front eye diagram, perform eye diagram equalization (EQ) processing on the eye height data and eye width data of the front eye diagram, and obtain the simulated rear eye diagram. High data and eye width data;

Obtain the test temperature value, and calculate the temperature compensation value according to the test temperature value and the pre-obtained temperature compensation function;

The temperature compensation value is used to perform compensation processing on the simulated post-eye diagram eye height data and eye width data, and compensated simulated eye height data and simulated eye width data are obtained.

In an exemplary embodiment, obtaining the test temperature value includes:

Collect the temperature value at the test site, or obtain the ambient temperature value set by the tester to be simulated.

In an exemplary embodiment, the simulation test method is used to simulate data received by the source driving circuit.

In an exemplary embodiment, the temperature compensation function is:

Among them: t is the temperature in degrees Celsius, k ₁ and k ₂ are S-IC parameters.

In an exemplary embodiment, the temperature compensation value is used to perform compensation processing on the simulated post-eye diagram eye height data and eye width data, and the compensated simulated eye height data and simulated eye width data are obtained, including: Use the following formulas to obtain the compensated simulated eye height data and simulated eye width data:

V _eye(back) '=T(t)*V _eye(back) , PE _eye(back) '=T(t)*PE _eye(back) ,

Among them, T(t) is the temperature compensation value, V _eye(back) ' is the simulated eye height data after compensation, V _eye(back) is the simulated back eye diagram eye height data, PE _eye(back) ' is the compensated eye height data. The simulated eye width data, PE _{eye (rear)} is the simulated back eye width data.

In an exemplary embodiment, the method further includes: restoring a posterior eye diagram image according to the compensated simulated eye height data and simulated eye width data.

In an exemplary embodiment, the simulation testing method is used to simulate testing a display panel that meets any one or more of the following conditions:

Condition 1: The size is greater than or equal to 65 inches or 75 inches;

Condition 2: The horizontal resolution is greater than or equal to 4k or 8k;

Condition 3: The refresh frequency is greater than or equal to 120hz.

On the other hand, embodiments of the present disclosure also provide a simulation test device, including a processor and a memory storing a computer program that can be run on the processor, wherein the above simulation test is implemented when the processor executes the program. Method steps.

In an exemplary embodiment, the simulation test device further includes a temperature acquisition unit.

On the other hand, embodiments of the present disclosure also provide a computer-readable storage medium that stores a computer program that can be run on a processor. When the computer program is executed by the processor, it is used to implement the above simulation testing method.

The simulation test method and device provided by the embodiments of the present disclosure can avoid the attenuation of the eye diagram signal caused by the ambient temperature by performing temperature compensation on the simulated rear eye diagram eye height and eye width data, making the test results more accurate.

Of course, implementing any product or method of the present disclosure does not necessarily require achieving all the above-mentioned advantages simultaneously. Additional features and advantages of the disclosure will be set forth in the description of the examples that follow, and, in part, will be apparent from the description of the examples, or may be learned by practice of the disclosure. The objectives and other advantages of the disclosed embodiments may be realized and obtained by the structure particularly pointed out in the specification, claims and appended drawings.

Description of the drawings

The drawings are used to provide a further understanding of the technical solution of the present disclosure, and constitute a part of the specification. They are used to explain the technical solution of the present disclosure together with the embodiments of the present disclosure, and do not constitute a limitation of the technical solution of the present disclosure. The shapes and sizes of components in the drawings do not reflect true proportions and are intended only to illustrate the present disclosure.

Figure 1 is a flow chart of a simulation testing method according to an embodiment of the present disclosure;

Figure 2 is a simulation test process of an embodiment of the present disclosure;

Figure 3 is a schematic structural diagram of a simulation testing device according to an embodiment of the present disclosure.

Detailed ways

The present disclosure describes multiple embodiments, but the description is illustrative rather than restrictive, and it is obvious to a person of ordinary skill in the art that within the scope of the embodiments described in the present disclosure, There are many more examples and implementations. Although many possible combinations of features are shown in the drawings and discussed in the embodiments, many other combinations of the disclosed features are possible. Unless expressly limited, any feature or element of any embodiment may be used in combination with, or may be substituted for, any other feature or element of any other embodiment.

The present disclosure includes and contemplates combinations with features and elements known to those of ordinary skill in the art. The disclosed embodiments, features and elements of this disclosure may also be combined with any conventional features or elements to form unique inventive solutions as defined by the claims. Any feature or element of any embodiment may also be combined with features or elements from other inventive solutions to form another unique inventive solution as defined by the claims. Accordingly, it should be understood that any feature shown and/or discussed in this disclosure may be implemented individually or in any suitable combination. Accordingly, the embodiments are not to be limited except by those appended claims and their equivalents. Furthermore, various modifications and changes may be made within the scope of the appended claims.

Additionally, in describing representative embodiments, the specification may have presented methods and/or processes as a specific sequence of steps. However, to the extent that the method or process does not rely on the specific order of steps described herein, the method or process should not be limited to the specific order of steps described. As one of ordinary skill in the art will appreciate, other sequences of steps are possible. Therefore, the specific order of steps set forth in the specification should not be construed as limiting the claims. Furthermore, claims directed to the method and/or process should not be limited to steps performing them in the order written, as those skilled in the art will readily appreciate that such order may be varied and still remain within the spirit and scope of the disclosed embodiments. Inside.

Unless otherwise defined, technical or scientific terms used in this disclosure have their ordinary meanings understood by a person of ordinary skill in the art to which this disclosure belongs. "First", "second" and similar words used in this disclosure do not indicate any order, quantity or importance, but are only used to distinguish different components. In this disclosure, "plurality" may represent two or more numbers. Words such as "include" or "include" mean that the elements or things appearing before the word include the elements or things listed after the word and their equivalents, without excluding other elements or things.

In order to keep the following description of the embodiments of the present disclosure clear and concise, the present disclosure omits detailed descriptions of some well-known functions and well-known components. The drawings of the embodiments of the present disclosure only refer to structures related to the embodiments of the present disclosure, and other structures may refer to common designs.

The inventor of the present application found that when the test images are non-overload images and overload images, the quality of the front eye images is the same. In theory, after the same EQ processing, the rear eye images should also be the same. However, in actual tests, the eye images failed. The situation is different. There is no eye pattern failure under the non-overloaded screen, but there is an eye pattern failure under the overloaded screen. That is, the actual test results are inconsistent with the theory. The reload screen generally refers to the display test of the display panel under certain extreme circumstances. For example, under certain pixel voltage flip modes and corresponding special test images, the common electrode of the display panel will be subject to the capacitive coupling effect from the pixel charging data line, causing the common electrode voltage to become unstable. In severe cases, it will This causes the screen to display poorly. These special display test screens are called overload screens, which can be understood as an extreme test of the display performance of the display under various "load-bearing" conditions. Through extensive testing and analysis of different S-ICs, it was found that the simulation results were inconsistent with the actual test results because the thin film transistor (TFT) inside the S_IC was affected by temperature under heavy load conditions, which resulted in different actual test results. based on theoretical simulation results. Therefore, the inventor considered the need to modify the simulation test method and add the environmental temperature factor to the EQ algorithm to correct the test results and eliminate the influence of temperature factors on the test results.

The embodiment of the present disclosure provides a simulation test method that can be used to simulate the data received by the source driver circuit, that is, simulate the back eye diagram of the source driver, as shown in Figure 1, including the following steps:

Step 10: Receive the front eye image, obtain the eye height data and eye width data of the front eye image, perform eye diagram equalization (EQ) processing on the eye height data and eye width data of the front eye image, and obtain the simulated rear eye image. Eye diagram eye height data and eye width data;

In an exemplary embodiment, the front eye image can be understood as front eye image data, and the front eye image data can be a pair of differential signal data, including all data of the front eye image. The algorithm function obtains the eye height data and eye width data in the front eye image. As shown in Figure 2, the CEDSA and CEDSB input in the figure are a pair of differential signal data. After processing by function F(t), the eye height data and eye width data in the eye diagram can be obtained.

In an exemplary embodiment, the eye height data and eye width data of the simulated back eye diagram are respectively:

V _{eye (back)} = H (V _{eye (front)} ); PE _{eye (back)} = L (PE _{eye (front)} );

Among them, V _{eye (back)} is the simulated rear eye height data, H () is the simulation algorithm for calculating eye height, V _{eye (front)} is the front eye height data, and PE _{eye (back)} is the simulated rear eye height. Eye diagram eye width data, L() is the simulation algorithm for calculating eye width, PE _eye(front) is the front eye diagram eye width data.

H() and L() can be implemented using the mature eye diagram equalization (EQ) algorithm in related technologies. The EQ algorithm is also called the eye diagram enhancement algorithm and can be used to simulate the rear eye diagram.

Step 20: Obtain the test temperature value, and calculate the temperature compensation value according to the test temperature value and the pre-obtained temperature compensation function;

In an exemplary embodiment, the temperature compensation function can be obtained in advance by testing different S-ICs at different temperatures to obtain front-eye diagram data of different S-ICs at different temperatures and corresponding actual measured values. The rear eye pattern data is compared with the eye height and eye width data in the eye pattern data, including comparing the eye height in the front eye pattern data with the rear eye pattern data of the same S-IC at the same temperature, and For the eye width in the front eye diagram data and the rear eye diagram data, by fitting a large number of comparison results, the following temperature compensation function can be obtained:

Among them: t is the temperature in degrees Celsius, k ₁ and k ₂ are S-IC parameters, which depend on the design method of S-IC. Different manufacturers have different S-IC designs, so k ₁ and k ₂ will also be different. It can be obtained based on the high-temperature eye diagram test results during the product design stage.

In an exemplary embodiment, there are many ways to obtain the test temperature value. For example, the temperature value of the test site can be collected as the test temperature value through a temperature acquisition unit (such as a temperature sensor), or the test temperature value can be an ideal value set by the tester. The ambient temperature value to be simulated.

Step 30: Use the temperature compensation value to perform compensation processing on the simulated post-eye diagram eye height data and eye width data, and obtain compensated simulated eye height data and simulated eye width data;

In an exemplary embodiment, the compensated simulated eye height data and simulated eye width data can be obtained using the following formulas:

V _eye(rear) '=T(t)*V _eye(rear) =T(t)*H(V _eye(front) );

PE _eye(back) '=T(t)*PE _eye(back) =T(t)*L(PE _eye(front) );

Among them, T(t) is the temperature compensation value, V _eye(back) ' is the compensated simulated eye height data, that is, the compensated simulated back eye diagram eye height data, H() is the simulation algorithm for calculating eye height, PE _{eye (back)} ' is the simulated eye width data after compensation, that is, the simulated back eye width data after compensation, and L() is the simulation algorithm for calculating eye width.

In an exemplary embodiment, after step 30, the method may further include restoring the posterior eye diagram image according to the compensated simulated eye height data and simulated eye width data. As shown in Figure 2, the back eye diagram can be restored through the processing of function F’(t). F’(t) processing is the opposite processing to F(t) processing. In an exemplary embodiment, a mature algorithm in the related art may be used to restore the rear eye diagram based on the eye height data and eye width data.

Using the simulation test method and device of the embodiments of the present disclosure, by performing temperature compensation on the simulated rear eye diagram eye height and eye width data, the attenuation of the eye diagram transmission signal caused by the ambient temperature can be avoided, making the test results more accurate. Using the above method to test a variety of different S-ICs, the simulation results all met expectations.

Although the embodiment of the present disclosure takes the simulation of the back eye pattern of a source driver as an example, those skilled in the art can know that when it is necessary to simulate the back eye diagram of other devices, if there is a temperature effect, this method can be used. The method of the disclosed embodiment performs temperature compensation on the eye height data and eye width data of the posterior eye diagram.

The methods and devices of the embodiments of the present disclosure are particularly suitable for testing large-size display panels. For example, simulation testing can be performed on display panels that meet any one or more of the following conditions:

Condition 1: The size is greater than or equal to 65 inches or 75 inches;

Condition 2: The horizontal resolution is greater than or equal to 4k or 8k;

Horizontal resolution 4k refers to an image whose pixel value per row in the horizontal direction reaches or is close to 4096 pixels, such as 4096*2160 or 3840*2160, both of which can be considered 4k resolution. Horizontal resolution 8k refers to an image whose pixel value per row in the horizontal direction reaches or is close to 8192 pixels, such as 7680×4320.

Condition 3: The refresh frequency is greater than or equal to 120hz.

In an exemplary embodiment, the present disclosure also provides a simulation test device, which may include a processor and a memory, the memory stores a computer program that can be run on the processor, wherein when the processor executes the computer program Implement the steps of the simulation testing method in any of the above embodiments of the present disclosure.

In an exemplary embodiment, the simulation test device may further include a temperature acquisition unit, such as a temperature sensor.

In an exemplary embodiment, FIG. 3 is a schematic structural diagram of a simulation testing device in an embodiment of the present disclosure. As shown in Figure 3, the device 50 includes: at least one processor 501; and at least one memory 502 and bus 503 connected to the processor 501; wherein the processor 501 and the memory 502 complete communication with each other through the bus 503; processing The processor 501 is used to call program instructions in the memory 502 to execute the steps of the simulation test method in any of the above embodiments.

The processor can be a central processing unit (CPU), a microprocessor unit (MPU), a digital signal processor (DSP), an application specific integrated circuit (ASIC), or an off-the-shelf programmable gate array ( Field Programmable Gate Array (FPGA), transistor logic devices, etc., this disclosure does not limit this.

The memory may include Read Only Memory (ROM) and Random Access Memory (RAM), and provides instructions and data to the processor. A portion of the memory may also include non-volatile random access memory. For example, the memory may also store device type information.

In addition to the data bus, the bus may also include a power bus, a control bus, a status signal bus, etc. However, for the sake of clarity, various buses are labeled as buses in Figure 3.

During implementation, the processing performed by the processing device may be completed by instructions in the form of integrated logic circuits of hardware or software in the processor. That is to say, the method steps of the embodiments of the present disclosure may be implemented by a hardware processor, or may be executed by a combination of hardware and software modules in the processor. Software modules can be located in random access memory, flash memory, read-only memory, programmable read-only memory or electrically erasable programmable memory, registers and other storage media. The storage medium is located in the memory, and the processor reads the information in the memory and completes the steps of the above method in combination with its hardware. To avoid repetition, it will not be described in detail here.

In an exemplary embodiment, an embodiment of the present disclosure also provides a non-volatile computer-readable storage medium having a computer program executable on a processor stored thereon, and the computer program is used by the processor. Implement the steps of the aforementioned simulation test method during execution.

Those of ordinary skill in the art can understand that all or some steps, systems, and functional modules/units in the devices disclosed above can be implemented as software, firmware, hardware, and appropriate combinations thereof. In hardware implementations, the divisions between functional modules/units mentioned in the above description are not uniform; for example, one physical component may have multiple functions, or one function or step may be performed cooperatively by several physical components. Some or all of the components may be implemented as software executed by a processor, such as a digital signal processor or a microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on computer-readable media, which may include computer storage media (or non-transitory media) and communication media (or transitory media). As is known to those of ordinary skill in the art, the term computer storage media includes volatile and nonvolatile media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data. removable, removable and non-removable media. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, Digital Versatile Disk (DVD) or other optical disk storage, magnetic cassettes, tapes, disk storage or other magnetic storage devices, or may Any other medium used to store the desired information and that can be accessed by a computer. Additionally, it is known to those of ordinary skill in the art that communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism, and may include any information delivery media .

Although the embodiments disclosed in the present disclosure are as above, the described contents are only used to facilitate the understanding of the present disclosure and are not intended to limit the present disclosure. Any person skilled in the field to which this disclosure belongs can make any modifications and changes in the form and details of the implementation without departing from the spirit and scope of this disclosure. However, the patent protection scope of this disclosure still must The scope is defined by the appended claims.

Claims (7)

1. A method of analog testing, comprising:

receiving a front eye diagram, obtaining eye height data and eye width data of the front eye diagram, and performing eye balance (EQ) processing on the eye height data and the eye width data of the front eye diagram to obtain simulated back eye diagram eye height data and eye width data;

acquiring a test temperature value, and calculating to obtain a temperature compensation value according to the test temperature value and a temperature compensation function obtained in advance; the temperature compensation function is:

wherein: t is the temperature in degrees centigrade, k ₁ 、k ₂ Is a source driver parameter;

and compensating the simulated back eye pattern eye height data and the simulated eye width data by using the temperature compensation value to obtain compensated simulated eye pattern eye height data and simulated eye width data so as to avoid attenuation of back eye pattern transmission signals caused by ambient temperature, wherein the compensated simulated eye pattern eye height data and simulated eye width data are obtained by adopting the following formulas:

V _{eye (rear)} ’＝T(t)*V _eye (rear)

PE _{eye (rear)} ’＝T(t)*PE _eye (rear)

Wherein T (T) is a temperature compensation value, V _{eye (rear)} ' is the compensated analog eye height data, V _{eye (rear)} PE for simulated back eye height data _{eye (rear)} ' PE for compensated analog eye width data _{eye (rear)} Is simulated back eye width data;

and restoring the back eye image according to the compensated simulated eye height data and simulated eye width data.

2. The method of claim 1, wherein the obtaining a test temperature value comprises:

and acquiring a temperature value of a test site or acquiring an environment temperature value to be simulated, which is set by a tester.

3. The method of claim 1, wherein the analog test method is used to simulate data received by a source driver circuit.

4. A method according to claim 1 or 3, wherein the analogue test method is used for analogue testing of a display panel meeting any one or more of the following conditions:

first, the size is greater than or equal to 65 inches or 75 inches;

the second condition is that the horizontal resolution is greater than or equal to 4k or 8k;

condition three, the refresh frequency is greater than or equal to 120hz.

5. An analogue test device comprising a processor and a memory storing a computer program executable on the processor, wherein the processor implements the steps of the analogue test method as claimed in any one of claims 1 to 4 when the program is executed by the processor.

6. The analog testing device of claim 5, further comprising a temperature acquisition unit.

7. A computer readable storage medium, characterized in that it has stored thereon a computer program executable on a processor, which computer program, when executed by the processor, implements the steps of the simulation test method according to any of claims 1 to 4.